Abstract
The use of magnetic force microscopy (MFM) for characterisation of permanent magnet samples offers moderate-to-high resolution data with minimal sample preparation. The technique yields contrast mapping of the magnetic stray field distribution above the sample surface. Necessary considerations include interpretation of the stray field data to yield domain structures, influence of the topography on the observed magnetic structures, and influence of the sample stray field on tip magnetization. We have used sintered NdFeB-type materials to examine these aspects of MFM.
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© 1997 Springer Science+Business Media Dordrecht
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Folks, L., Woodward, R.C., Babcock, K.L., Street, R. (1997). Magnetic Force Microscopy of Sintered NdFeB. In: Hadjipanayis, G.C. (eds) Magnetic Hysteresis in Novel Magnetic Materials. NATO ASI Series, vol 338. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5478-9_21
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DOI: https://doi.org/10.1007/978-94-011-5478-9_21
Publisher Name: Springer, Dordrecht
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