Abstract
The reliability of stand-alone photovoltaic systems is analyzed in terms of the Loss of Load Probability, LLP. With the idea of simplifier the design of PV systems a new analytic model, as accurate as the numerical models and as simple as analytic models, is proposed. For each location, the model requires as input 4 different coefficients, that can be obtained using a set of coefficient maps.
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© 1991 Springer Science+Business Media Dordrecht
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Egido, M.A., Lorenzo, E. (1991). Fiability Coefficient Maps for PV Systems Design. In: Luque, A., Sala, G., Palz, W., Dos Santos, G., Helm, P. (eds) Tenth E.C. Photovoltaic Solar Energy Conference. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-3622-8_126
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DOI: https://doi.org/10.1007/978-94-011-3622-8_126
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-5607-6
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