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Low Energy Electron Microscopy

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Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications

Part of the book series: NATO ASI Series ((NSSE,volume 235))

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Abstract

The basic principles and some applications of low energy electron microscopy (LEEM) are briefly described. The relationship between LEEM and other topics of this conference are pointed out.

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References

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Author information

Authors and Affiliations

  1. Physikalisches Institut, Technische Universität Clausthal, D 3392, Clausthal-Zellerfeld, Germany

    E. Bauer

Authors
  1. E. Bauer
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Editor information

Editors and Affiliations

  1. Department of Material Physics, Université Claude Bernard Lyon 1, 69622, Villeurbanne, France

    Vu Thien Binh

  2. Department of Condensed Materials, Universidad Autonoma de Madrid, Ciudad Universitaria de Canto Blanco, 28049, Madrid, Spain

    Nicolas Garcia

  3. Faculty of Physics, Universität Konstanz, Universitätsstrasse, Postfach 5560, D-7750, Konstanz 1, Germany

    Klause Dransfeld

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© 1993 Springer Science+Business Media Dordrecht

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Bauer, E. (1993). Low Energy Electron Microscopy. In: Binh, V.T., Garcia, N., Dransfeld, K. (eds) Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications. NATO ASI Series, vol 235. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1729-6_2

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  • DOI: https://doi.org/10.1007/978-94-011-1729-6_2

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-4758-6

  • Online ISBN: 978-94-011-1729-6

  • eBook Packages: Springer Book Archive

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