Abstract
In numerous fields especially microelectronics, optics and optoelectronics, thin-films have reached a paramount importance. In order to improve the efficiency of thin-film devices, a careful characterization of these materials is necessary. From this point of view optical spectroscopy is of great practical interest. By optical spectroscopy we mean the determination of optical parameters, such as refractive-index and absorption coefficient as a function of the wavelength. The knowledge of these parameters which is obviously essential in the case of thin-films intended for optical applications remains however useful in some other cases. For example optical spectroscopy,as it allows band-structure as well as defect-states in the band-gap and free-carriers effects to be studied,is especially useful in the case of semiconductive thin-films intended for purely electronic applications.
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© 1984 Springer Science+Business Media Dordrecht
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Olivier, M. (1984). Guided-Wave Optical Spectroscopy of Thin Films. In: Ostrowsky, D.B., Spitz, E. (eds) New Directions in Guided Wave and Coherent Optics. NATO ASI Series, vol 78/79. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-9550-1_31
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DOI: https://doi.org/10.1007/978-94-010-9550-1_31
Publisher Name: Springer, Dordrecht
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