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Defect-Free Vitreous Networks: The Idealised Structure of SiO2 and Related Glasses

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Defects in SiO2 and Related Dielectrics: Science and Technology

Part of the book series: NATO Science Series ((NAII,volume 2))

Abstract

“Randomness and disorder are almost synonymous with uncertainty and ignorance.” G.S. Rushbrooke Whereas, for crystalline materials, the concept of a defect is easy to define, the same is not true for amorphous solids*, due to the statistical fluctuations which are an inherent feature of their structure. Thus, before it is possible to identify defects in an amorphous structure, it is first necessary to establish what is meant by the ideal defect-free structure into which they are to be introduced and, in particular, the extent of such fluctuations which can be considered to be a normal and integral part of that structure. It should also be noted that, since the ideal structure is disordered, departures from normality can occur in the direction of both decreased and increased order, the former leading to what are commonly known as defects.

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Authors and Affiliations

  1. J.J. Thomson Physical Laboratory, University of Reading, Whiteknights, Reading, RG6 6AF, U.K.

    Adrian C. Wright

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  1. Adrian C. Wright
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Editors and Affiliations

  1. Dipartimento di Scienza dei Materiali, Università Milano-Bicocca, Milano, Italy

    G. Pacchioni

  2. Institute of Solid State Physics, University of Latvia, Riga, Latvia

    L. Skuja

  3. Naval Research Laboratory, Washington DC, USA

    D. L. Griscom

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Wright, A.C. (2000). Defect-Free Vitreous Networks: The Idealised Structure of SiO2 and Related Glasses. In: Pacchioni, G., Skuja, L., Griscom, D.L. (eds) Defects in SiO2 and Related Dielectrics: Science and Technology. NATO Science Series, vol 2. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0944-7_1

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  • DOI: https://doi.org/10.1007/978-94-010-0944-7_1

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-6686-7

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