Abstract
This study presents a novel porous silicon (pSi) fabrication method for the matrix-free desorption/ionization on silicon mass spectrometry (DIOS-MS). The fabrication conditions and surface treatments of pSi on DIOS-MS performance are explored. Utilization of pSi sample plates in the analysis of low molecular weight pharmaceutical compounds is shown.
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© 2002 Springer Science+Business Media Dordrecht
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Tuomikoski, S. et al. (2002). Modified Porous Silicon Surfaces as DIOS-MS Sample Plates. In: Baba, Y., Shoji, S., van den Berg, A. (eds) Micro Total Analysis Systems 2002. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0295-0_168
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DOI: https://doi.org/10.1007/978-94-010-0295-0_168
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-3952-9
Online ISBN: 978-94-010-0295-0
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