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Modified Porous Silicon Surfaces as DIOS-MS Sample Plates

  • Conference paper
Micro Total Analysis Systems 2002

Abstract

This study presents a novel porous silicon (pSi) fabrication method for the matrix-free desorption/ionization on silicon mass spectrometry (DIOS-MS). The fabrication conditions and surface treatments of pSi on DIOS-MS performance are explored. Utilization of pSi sample plates in the analysis of low molecular weight pharmaceutical compounds is shown.

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References

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© 2002 Springer Science+Business Media Dordrecht

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Tuomikoski, S. et al. (2002). Modified Porous Silicon Surfaces as DIOS-MS Sample Plates. In: Baba, Y., Shoji, S., van den Berg, A. (eds) Micro Total Analysis Systems 2002. Springer, Dordrecht. https://doi.org/10.1007/978-94-010-0295-0_168

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  • DOI: https://doi.org/10.1007/978-94-010-0295-0_168

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-3952-9

  • Online ISBN: 978-94-010-0295-0

  • eBook Packages: Springer Book Archive

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