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Surface Chemical Probes and their Application to the Study of in Situ Semiconductor Processing

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Emerging Technologies for In Situ Processing

Part of the book series: NATO ASI Series ((NSSE,volume 139))

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Abstract

Reactions at semiconductor-vapour interfaces as stimulated thermally and by incident photon, electron and ion radiation permit a wide range of thin film transformations in the semiconductor surface to be carried out (1). The processes involved include: (i) dry etching of semiconductors, metals and dielectrics (ii) epitaxial growth of elemental and compound layers (iii) growth of dielectrics (iv) deposition of metals and metal alloys. Since photon, electron and ion beams can also be spatially defined, either through the use of physical masks or highly focussed beams, in theory it should therefore be possible to achieve in situ the complete fabrication of electronic devices and integrated circuits or their repair and modification. The chemistry underlying the processing methods involved is extremely complex. Even in the most chemically simple reaction, MBE of semiconducting materials from elemental beams under ultra-high vacuum, a number of surface processes must be taken into account in order to achieve a full description of the phenomena (2). When other processing techniques are examined, very many more factors must be looked at. Thus if complex compounds as opposed to the elements are employed, the chemical conversions demanded become more sophisticated and the fate of a variety of species generated in the reaction must be controlled. At higher pressures (MOVPE etc) the fluid dynamics in the reaction cell has an important influence. When photon, electron or ion beams are used elementary steps as excited electronically and by momentum transfer are brought into play; such steps can occur in the gaseous, adsorbed or substrate phases present. Nevertheless, the optimisation of particular processing methods must rest on achieving a good description of the underlying reactions. Since a significant (if not dominating) number of such reactions actually take place at the substrate-vapour interface, understanding the surface chemistry must be one of the major aims. In this article we therefore survey and illustrate some of the ways which might permit this to be achieved.

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References

  1. See, for example, papers contained within “Laser processing and dignastics (ll)” Bauere D: Kompa: KL and Laude: L(eds) E-MRS 11, (1986)

    Google Scholar 

  2. See, for example, Ploog: K Ann. Rev. Mat. Sci., 12 (1982) 123

    Article  CAS  Google Scholar 

  3. Czanderna: AVJ(ed): Methods of Surface Analysis Elesevier, Amersterdam (1985)

    Google Scholar 

  4. Kowalczy: SP and Miller: DL J. APP. Phys. 59 (1986) 287

    Article  CAS  Google Scholar 

  5. Ehrlich: DJ Tsao: JY and Bozler: CO J. Vac. Sci. Tech. B3 (1985) 1.

    CAS  Google Scholar 

  6. Jackman: RB Foord: JS Adams: AE and Lloyd: LJ. Appl. Phys. 59 (1986) 123

    Article  Google Scholar 

  7. Chesters: MA J. Elec. Spec. 38 (1986) 123

    Article  CAS  Google Scholar 

  8. Marra: WC Eisenberger: P and Cho: AY J. Appl. Phys. 50 (1979) 6927

    Article  CAS  Google Scholar 

  9. Eisenberger: P and Marra: WC Phys. Rev. Letts 46 (1981) 1081

    Article  CAS  Google Scholar 

  10. Robinson: IK Phys. Rev. Letts. 50 (1983) 1145

    Article  CAS  Google Scholar 

  11. Bohr: J Feidenhars: R Nielsen: M Toney: M Johson: RJ and Robinson: IK Phys. Rev. Letts 54 (1985) 1275

    Article  CAS  Google Scholar 

  12. TomsH: WK Mate: CM Zhu: XD Crowell: JE Heinz: TF Somorzair: GA and Shen: YR Phys. Rev. Letts. 52 (1984) 348

    Article  CAS  Google Scholar 

  13. Chenr: CK Heinzr: TF Ricard: D and Shen: YR Phys. Rev. Letts 46 (1981) 1010

    Article  Google Scholar 

  14. Tom: HVJK Zhu: XD Shen: YR and Somorjai: Ga Surf. Sci. 167 (1986) 167

    Article  CAS  Google Scholar 

  15. Binning: G Rohrer: H Gerber: Ch and Weibels: E Appl. Phys. Letts 40 (1982) 178

    Article  Google Scholar 

  16. Binnig: G Rohrer: H Gerber: Ch and Weibels: E Phys. Rev. Letts 50 (1983) 120

    Google Scholar 

  17. Jackman: RB Ebert: H and Foord: JS Surf. Sci. 176 (1986) 183

    Article  CAS  Google Scholar 

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© 1988 Martinus Nijhoff Publishers

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Jackman, R.B., Foord, J.S. (1988). Surface Chemical Probes and their Application to the Study of in Situ Semiconductor Processing. In: Ehrlich, D.J., Nguyen, V.T. (eds) Emerging Technologies for In Situ Processing. NATO ASI Series, vol 139. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1409-4_30

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  • DOI: https://doi.org/10.1007/978-94-009-1409-4_30

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-7130-7

  • Online ISBN: 978-94-009-1409-4

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