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A Study on the Tag Performance Test for International Standards Using RFID Emulator

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Computer Science and Convergence

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 114))

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Abstract

RFID technology uses communication through the use of radio waves to transfer data between a reader and an electronic tag attached to an object for the purpose of identification and tracking. RFID technology can be applied to the various service areas such as, position determination technology, remote processing management and information exchange between objects by collecting, storing, processing, and tracing their informations from the tag attached to the objects using electronic wave by recognizing the information and environment of those objects. However, to revitalize these various services, it is important to test the RFID tag performance. But there are few instructions which have and hold the RFID emulator technology for organizing the RFID international test environment. Also there are not many manufacturing companies which recognize about the exact RFID test standard and requirements for the International Standards. In this paper, a construction of Tag Performance test environments and test methods are suggested which are required by EPCglobal or ISO/IEC. Details about RFID Tag performance test items proposed by ISO/IEC FDIS 18046-3 are explained, performed RFID Tag performance test through the performing test against each measured item, and draw a result for the RFID Tag performance of International Standards. On the basis of this research, it is desired to contribute to develop a great performing RFID Tag product through the RFID Tag performance test which comes up to the International Standards and construct its application system and facilitate a revitalization of the RFID services.

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References

  1. ETRI Journal vol 22(3), RFID Technology and standardization trends, ETRI, 2007.06

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Correspondence to Hae-Gill Choi .

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© 2012 Springer Science+Business Media B.V.

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Choi , HG., Kim, SS., Cho, MT., Joo, HJ., Lee, ES. (2012). A Study on the Tag Performance Test for International Standards Using RFID Emulator. In: J. (Jong Hyuk) Park, J., Chao, HC., S. Obaidat, M., Kim, J. (eds) Computer Science and Convergence. Lecture Notes in Electrical Engineering, vol 114. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-2792-2_60

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  • DOI: https://doi.org/10.1007/978-94-007-2792-2_60

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-007-2791-5

  • Online ISBN: 978-94-007-2792-2

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