Overview
- Introduction of model based hardware testing
- Describes fault models for nanoscaled CMOS technology
- Fault simulation, ATPG and diagnosis algorithms for complex fault models
- Comprehensive treatment including memory and low power aspects
Part of the book series: Frontiers in Electronic Testing (FRET, volume 43)
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Table of contents (8 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Editors and Affiliations
Bibliographic Information
Book Title: Models in Hardware Testing
Book Subtitle: Lecture Notes of the Forum in Honor of Christian Landrault
Editors: Hans-Joachim Wunderlich
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-90-481-3282-9
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2010
Hardcover ISBN: 978-90-481-3281-2Published: 07 December 2009
Softcover ISBN: 978-94-007-3093-9Published: 01 March 2012
eBook ISBN: 978-90-481-3282-9Published: 12 November 2009
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: XIV, 257
Topics: Computer Hardware, Logics and Meanings of Programs, Simulation and Modeling, Circuits and Systems, Performance and Reliability