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Direct flux-noise measurement of Nb variable-thickness-bridges

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Advances in Superconductivity XI

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Abstract

In order to study the dynamics of vortices moving through superconducting thin film devices, we constructed the direct flux detection probe using a concentric thin-film planar gradiometer coupled to a dc SQUID. Measurements of static V-I and flux noise characteristics were made for variable-thickness-bridge (VTB) made on epitaxial Nb film. The critical current was unambiguously determined as the onset of flux noise and multiple step noise of the flux was observed above the critical current. The power spectrum showed the power-law behavior and Lorentzian-like form at different current values above the critical current. It is suggested that the multiple step noise is generated by successive entries of single vortices into the bridge. A simple gas flow model is used to explain the Lorentzian-like spectrum of the flux noise.

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Author information

Authors and Affiliations

  1. Research Institute for Electronic Sciences, Hokkaido University, Sapporo, 060-0812, Japan

    S. Hirano, Y. Hirata & S. Kuriki

  2. Muroran Institute of Technology, Muroran, 050-8585, Japan

    M. Matsuda

  3. Seiko Instruments Inc., Matsudo, Chiba, 270-2222, Japan

    T. Morooka & S. Nakayama

Authors
  1. S. Hirano
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  2. Y. Hirata
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  3. M. Matsuda
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  4. T. Morooka
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  5. S. Nakayama
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  6. S. Kuriki
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Editor information

Editors and Affiliations

  1. Superconductivity Research Laboratory, ISTEC, 1-10-13 Shinonome, Koto-ku, Tokyo, 135-0062, Japan

    Naoki Koshizuka (Deputy Director General, Director, Division 1) & Setsuko Tajima (Director, Division 2) (Deputy Director General, Director, Division 1) &  (Director, Division 2)

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© 1999 Springer Japan

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Hirano, S., Hirata, Y., Matsuda, M., Morooka, T., Nakayama, S., Kuriki, S. (1999). Direct flux-noise measurement of Nb variable-thickness-bridges. In: Koshizuka, N., Tajima, S. (eds) Advances in Superconductivity XI. Springer, Tokyo. https://doi.org/10.1007/978-4-431-66874-9_282

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  • DOI: https://doi.org/10.1007/978-4-431-66874-9_282

  • Publisher Name: Springer, Tokyo

  • Print ISBN: 978-4-431-66876-3

  • Online ISBN: 978-4-431-66874-9

  • eBook Packages: Springer Book Archive

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