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Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images

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Microbeam and Nanobeam Analysis

Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 13))

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Abstract

Two different approaches based on Fourier and fractal analyses, are applied for particle shape characterisation. The advantages and limitations of both approaches as well as their fields of application are discussed. Examples of the application of these approaches for particles of various types are given.

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Author information

Authors and Affiliations

  1. Micro- and Trace Analysis Center (MiTAC), Department of Chemistry, University of Antwerpen (UIA), B-2610, Antwerpen, Belgium

    Volodymyr V. Kindratenko, Pierre J. M. Van Espen, Boris A. Treiger & René E. Van Grieken

Authors
  1. Volodymyr V. Kindratenko
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  2. Pierre J. M. Van Espen
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  3. Boris A. Treiger
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  4. René E. Van Grieken
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Editor information

Editors and Affiliations

  1. Beauchamp, France

    Daniele Benoit

  2. Department PAP/CDP/CMT, C.N.E.T. France Telecom, Bagneux, France

    Jean-Francois Bresse

  3. Department of Chemistry, University of Antwerp (UIA), Antwerp-Wilrijk, Belgium

    Luc Van’t dack

  4. Waalre, The Netherlands

    Helmut Werner

  5. Institut für angewandte und technische Physik, Technische Universität, Wien, Austria

    Johann Wernisch

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© 1996 Springer-Verlag Wien

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Kindratenko, V.V., Van Espen, P.J.M., Treiger, B.A., Van Grieken, R.E. (1996). Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images. In: Benoit, D., Bresse, JF., Van’t dack, L., Werner, H., Wernisch, J. (eds) Microbeam and Nanobeam Analysis. Mikrochimica Acta Supplement, vol 13. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6555-3_28

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  • DOI: https://doi.org/10.1007/978-3-7091-6555-3_28

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-82874-8

  • Online ISBN: 978-3-7091-6555-3

  • eBook Packages: Springer Book Archive

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