Abstract
While the previous chapter was aimed at providing a basic understanding of dynamic atomic force microscopy, we turn now to the intermittent contact mode (or tapping mode) which the mode that is used most frequently under ambient conditions.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
The phase \(\phi (A/A_\mathrm {free})\) can be obtained numerically from (2.25) and (2.28). If this result is plotted in Fig. 15.3 it is indistinguishable on top of the curve obtained from (15.4). Alternatively (2.25) and (2.28) can be rearranged analytically leading to (15.4) in a very good approximation.
- 2.
If we approximate the tip-sample force by \(F_\mathrm {ts} = k' z\) (harmonic oscillator), \(\left\langle F_\mathrm {ts} \cdot z \right\rangle = - 1/2\,k' A^2\) results (cf. (17.10)). Inserting this into (15.11) and remembering that according to (15.4) \(A/A_\mathrm {free} = - \sin {\phi }\), the following expression for the phase is obtained \(\tan {\phi } = k/(k' Q_\mathrm {cant})\), which corresponds to expression (14.14) obtained for the harmonic oscillator.
- 3.
Correspondingly, the left “ear” also occurs on the high-frequency side of the resonance curve.
- 4.
Here we used the dependence \(\phi (A/A_\mathrm {free})\) while in an experiment the \(\phi (d)\) is obtained. However, the two dependences can be converted into each other using the (measured) \(A(d)\) dependence.
- 5.
There are also other reasons for the switch between different oscillation sates. For instance, the presence of a valley in the surface topography can enhance the attractive forces and thus change the force-distance behavior locally, resulting in a switch to another branch of the oscillation state.
- 6.
Since \(\phi <0\), \(\left\langle P_\mathrm {drive} \right\rangle \) is positive.
- 7.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2015 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Voigtländer, B. (2015). Intermittent Contact Mode/Tapping Mode. In: Scanning Probe Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-45240-0_15
Download citation
DOI: https://doi.org/10.1007/978-3-662-45240-0_15
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-45239-4
Online ISBN: 978-3-662-45240-0
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)