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Particle Optics of Electrons

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Transmission Electron Microscopy

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 36))

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Abstract

The acceleration of electrons in the electrostatic field between cathode and anode, the action of magnetic fields with axial symmetry as electron lenses and the application of transverse magnetic and electrostatic fields for electron-beam deflection and electron spectrometry can be analysed by applying the laws of relativistic mechanics and hence calculating electron trajectories. Lens aberrations can likewise be introduced and evaluated by this kind of particle optics. In the case of spherical aberration, however, it will also be necessary to express this error in terms of a phase shift, known as the wave aberration, by using the wave-optical model introduced in the next section.

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Authors and Affiliations

  1. Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Domagkstraße 75, D-4400, Münster, Fed. Rep. of Germany

    Professor Dr. Ludwig Reimer

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  1. Professor Dr. Ludwig Reimer
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© 1984 Springer-Verlag Berlin Heidelberg

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Reimer, L. (1984). Particle Optics of Electrons. In: Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-13553-2_2

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  • DOI: https://doi.org/10.1007/978-3-662-13553-2_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-13555-6

  • Online ISBN: 978-3-662-13553-2

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