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Optical Behaviour of Electroluminescent Devices

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Electroluminescence

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 38))

Abstract

In an optical multilayer thin film system, interference effects play an important role for the outcoupling of light due to the different refractive indices and thicknesses of the involved layers. A theoretical model has been investigated with the ability to calculate the outcoupled intensity of light for various wavelengths and viewing angles. ZnS:TbF3 ac-TFEL devices have been prepared to verify the model and to check the applicability of the theory to electroluminescent devices. Experimental and calculated wavelength and viewing angle dependent intensity data show good agreement. The outcoupling efficiency ηopt of a TFEL device can be increased up to 25% compared with the value given by the well known formula of the simple theory /1/.

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References

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Author information

Authors and Affiliations

  1. Institut für Physikalische Elektronik, Universität Stuttgart, Pfaffenwaldring 47, D-7000, Stuttgart 80, Fed. Rep. of Germany

    R. H. Mauch & H. W. Schock

  2. Laboratorium voor Electronica en Meettechniek, Rijksuniversiteit Gent, Sint-Pietersnieuwstraat 41, B-9000, Gent, Belgium

    K. A. Neyts

Authors
  1. R. H. Mauch
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  2. K. A. Neyts
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  3. H. W. Schock
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Editor information

Editors and Affiliations

  1. Department of Electronics, Tokyo Engineering University, 1404 Katakura, Hachioji, Tokyo 192, Japan

    Shigeo Shionoya Ph.D.

  2. Department of Electronics, Tottori University, Koyama, Tottori 680, Japan

    Hiroshi Kobayashi Ph.D.

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© 1989 Springer-Verlag Berlin, Heidelberg

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Mauch, R.H., Neyts, K.A., Schock, H.W. (1989). Optical Behaviour of Electroluminescent Devices. In: Shionoya, S., Kobayashi, H. (eds) Electroluminescence. Springer Proceedings in Physics, vol 38. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-93430-8_58

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  • DOI: https://doi.org/10.1007/978-3-642-93430-8_58

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-93432-2

  • Online ISBN: 978-3-642-93430-8

  • eBook Packages: Springer Book Archive

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