Abstract
The application of surface analytical techniques to the study of catalysts requires a number of experimental problems to be overcome. The active components are present in low concentration, dispersed in a high area porous solid, usually an insulator which charges electrostatically. Techniques to cope with these problems in the application of XPS and ISS are described. Analyses of alumina and alumina supported catalysts and related materials are presented with particular reference to the methods of correcting for charging of the sample, the detection of differential charging, the identification of surface impurities and the chemical state after catalyst conditioning processes.
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© 1993 Springer-Verlag Berlin Heidelberg
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Baker, B.G., Jasieniak, M. (1993). Surface Analysis of Catalysts by Electron Spectroscopy and Ion Scattering Spectroscopy. In: Howe, R.F., Lamb, R.N., Wandelt, K. (eds) Surface Science. Springer Proceedings in Physics, vol 73. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84933-6_22
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DOI: https://doi.org/10.1007/978-3-642-84933-6_22
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-84935-0
Online ISBN: 978-3-642-84933-6
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