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Ordering at Surfaces and Interfaces

Proceedings of the Third NEC Symposium Hakone, Japan, October 7–11, 1990

  • Conference proceedings
  • © 1992

Overview

Editors:
  1. Akio Yoshimori

    1. Department of Material Physics, Osaka University, Toyonaka, Osaka 560, Japan

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  2. Teruya Shinjo

    1. Institute for Chemical Research, Kyoto University, Uji, Kyoto-fu 611, Japan

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  3. Hisatsune Watanabe

    1. Fundamental Research Laboratories, NEC Corporation, Tsukuba, Ibaraki 305, Japan

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Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 17)

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Table of contents (41 papers)

  1. Front Matter

    Pages I-X
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  2. Surface Analysis

    1. Front Matter

      Pages 1-1
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    2. Ion and X-Ray Scattering Studies of Surface Disorder

      • J. F. van der Veen, R. G. van Silfhout, A. W. Denier van der Gon
      Pages 3-12

    3. Properties of Graphite and Monolayer Graphite Studied by Electron Energy Loss Spectroscopy and Scanning Tunneling Microscopy

      • C. Oshima, H. Itoh, T. Ichinokawa, T. Aizawa, R. Souda, S. Otani et al.
      Pages 13-20

    4. Surface Order and Disorder Studied by Scanning Tunneling Microscopy

      • A. A. Baski, C. A. Lang, J. Nogami, C. F. Quate
      Pages 21-29

    5. Electron Holography and Its Applications to Surface Observation

      • A. Tonomura
      Pages 31-38

    6. Effect of Tip Apex on STM and STS

      • O. Nishikawa, M. Tomotori, F. Iwawaki
      Pages 39-46

    7. Scanning Tunneling Microscopy of Stepped Si(111) Surfaces

      • H. Tokumoto, K. Miki
      Pages 47-53

    8. Energetics of Surface Atomic Processes

      • T. T. Tsong
      Pages 55-65

    9. Surface and Interface Structural Analysis by Coaxial Impact Collision Ion Scattering Spectroscopy (CAICISS)

      • M. Katayama, B. V. King, R. S. Daley, R. S. Williams, E. Nomura, M. Aono
      Pages 67-72

  3. Surface Ordering

    1. Front Matter

      Pages 73-73
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    2. Lattice Gas Simulation of the Surface Reconstruction of Si(111) and Ge(111)

      • J. Kanamori, Y. Sakamoto
      Pages 75-83

    3. Surface Dynamics on Si(001) Studied with a High Temperature Scanning Tunneling Microscope

      • D. Dijkkamp, E. J. van Loenen, H. B. Elswijk
      Pages 85-92

    4. Phase Transition of Si(001) Studied by LEED

      • Y. Murata, M. Kubota, T. Tabata
      Pages 93-100

    5. Angle-Resolved Electron Spectroscopy Study of the Surfaces and Interfaces of Silicon

      • S. Kono
      Pages 101-109

    6. Ordering and Electronic Structure of the Si(001) Surface

      • M. Nakayama
      Pages 111-122

    7. Aspects of Core-Level Photoemission from Semiconductor Surfaces: Resonant Emission and Final State Interaction

      • K. Cho
      Pages 123-128

    8. Molecular-Dynamics Simulation of the Structural Phase Transition on the Si(100) Surface

      • S. Sawada
      Pages 129-136

    9. Short Range Order in the Phase Transition of the Si(100) Surface Reconstruction

      • K. Kakitani, A. Yoshimori
      Pages 137-143

    10. Mechanism of Reconstruction of Si(100) Surfaces

      • M. Tsukada, N. Shima, Z. Zhu, K. Kobayashi, H. Kageshima, N. Isshiki
      Pages 145-152
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Keywords

About this book

This volume contains the proceedings of the third in a series of biennial NEC Symposia on Fundamental Approaches to New Material Phases sponsored by the NEC Corporation, Tokyo, Japan. The symposium was held from October 7 to 11, 1990, at the Hakone Kanko H9tel in Hakone. About 40 invited participants stayed together, became involved in intense discussions, and freely exchanged ideas both in and out of the conference room, which faced Mt. Fuji, the beautiful lake Ashinoko, and the quiet landscape in the old crater. The title of this volume, Ordering at Surfaces and Interfaces, which was also the title of the third symposium, describes the aim of the symposium: to discuss ordering properties and their underlying mechanisms at surfaces and interfaces. The topics treated include the reconstruction of surfaces of semiconductors and metals, atomic and magnetic ordering at interfaces, theoretical tools to study or­ dering mechanisms at surfaces and interfaces, ordering in adsorbate-surface sys­ tems, such as alkali-adsorbed silicon surfaces, electric current effects on semicon­ ductor surfaces and many related STM (scanning tunneling microscopy) results.

Editors and Affiliations

  • Department of Material Physics, Osaka University, Toyonaka, Osaka 560, Japan

    Akio Yoshimori

  • Institute for Chemical Research, Kyoto University, Uji, Kyoto-fu 611, Japan

    Teruya Shinjo

  • Fundamental Research Laboratories, NEC Corporation, Tsukuba, Ibaraki 305, Japan

    Hisatsune Watanabe

Bibliographic Information

  • Book Title: Ordering at Surfaces and Interfaces

  • Book Subtitle: Proceedings of the Third NEC Symposium Hakone, Japan, October 7–11, 1990

  • Editors: Akio Yoshimori, Teruya Shinjo, Hisatsune Watanabe

  • Series Title: Springer Series in Materials Science

  • DOI: https://doi.org/10.1007/978-3-642-84482-9

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1992

  • Softcover ISBN: 978-3-642-84484-3Published: 30 December 2011

  • eBook ISBN: 978-3-642-84482-9Published: 06 December 2012

  • Series ISSN: 0933-033X

  • Series E-ISSN: 2196-2812

  • Edition Number: 1

  • Number of Pages: X, 379

  • Topics: Surfaces and Interfaces, Thin Films, Physical Chemistry

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