Abstract
The availability of high brightness (flux/unit area) monochromatized synchrotron radiation [10.1] has allowed the development of new experimental techniques which tune into specific surface atoms and probe their structural environment. Two such techniques, the subject of this chapter, are the surface extended X-ray absorption fine structure (SEXAFS) and near-edge X-ray absorption fine structure (NEXAFS) techniques. Both measure the X-ray absorption by a specific atom on the surface which is distinguished from other atoms by one of its main absorption edges (usually K or L edge).
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
For a review see: Synchrotron Radiation Research, ed. by H. Winick, S. Doniach ( Plenum, New York 1980 )
P.H. Citrin, P. Eisenberger, R.C. Hewitt: Phys. Rev. Lett. 41, 309 (1978);
J. Stöhr, D. Denley, P. Perfetti: Phys. Rev. 818, 4132 (1978)
J. Stöhr: Jpn. J. Appl. Phys. 17, Suppl. 17–2, 217 (1978)
For reviews of SEXAFS spectroscopy see:
J. Stöhr: In Emission and Scattering Techniques,ed. by P. Day (Reidel, Dordrecht 1981) and SSRL Report 80/07;
J. Stöhr, R. Jaeger, S. Brennan: Surf. Sci. 117, 503 (1982);
J. Stöhr: In Principles, Techniques and Applications of EXAFS, SEXAFS and XANES, ed. by R. Prins, D. Koningsberger ( Wiley, New York 1984 )
D.E. Sayers, F.W. Lytle, E.A. Stern: Phys. Rev. Lett. 27, 1204 (1971)
E.A. Stern: Contemp. Phys. 19, 289 (1978);
P. Eisenberger, B.M. Kincaid: Science 200, 1441 (1978);
D.R. Sandstrom, F.W. Lytle: Ann. Rev. Phys. Chem. 30, 215 (1979);
P. Rabe, R., Haensel: In Festkörperprobleme 20 (Pergamon-Vieweg, Stuttgart, 1980) p. 43;
P.A. Lee, P.H. Citrin, P. Eisenberger, B.M. Kincaid: Rev. Modern Physics 53, 769 (1981);
f) B.K. Teo, D.C. Joy (eds.): EXAFS Spectroscopy, Techniques and Applications ( Plenum, New York 1981 )
A. Bianconi: Appl. Surf. Sci. 6, 392 (1980)
P.J. Durham, J.B. Pendry, C.H. Hodges: Comput. Phys. Comm. 25, 193 (1982)
C.R. Natoli: Proceedings of the First Internat. Conf. on EXAFS and XANES, Frascati, Italy, 1982. Springer Ser. Chem. Phys., Vol.27 (Springer, Berlin, Heidelberg, New York 1982 ) p. 43
J.L. Dehmer, D. Dill: In Electron Molecule and Photon—Molecule Collisions, ed. by T. Rescigno, V. McKoy, B. Schneider ( Plenum, New York 1979 ) p. 225
J.L. Dehmer, D. Dill: J. Chem. Phys. 65, 5327 (1976)
C.R. Natoli, D.K. Misemer, S. Doniach, F.W. Kutzler: Phys. Rev. A22, 1104 (1980)
A. Bianconi, M. Del’Ariccia, P.J. Durham, J.B. Pendry: Phys. Rev. B26, 6502 (1982)
G.N. Greaves, P.J. Durham, G. Diakun, P. Quinn: Nature 294, 139 (1981)
P.H. Gaskell, D.M. Glover, A.K. Livesey, P.J. Durham, G.N. Greaves: J. Phys. C: Solid State Phys. 15, L597 (1982)
J.E. Müller, W.L. Schaich: Phys. Rev. B27, 6489 (1983)
J. Stöhr, K. Baberschke, R. Jaeger, T. Treichler, S. Brennan: Phys. Rev. Lett. 47, 381 (1981)
J. Stöhr, R. Jaeger: Phys. Rev. B26, 4111 (1982)
J.B. Pendry: Low Energy Electron Diffraction ( Academic, New York 1974 )
C.B. Duke: In Surface Effects in Crystal Plasticity, ed. by R.M. La Tanision and J.F. Fourie (Nordhoff, Leyden 1977); F. Jona: J. Phys. C11, 4271 (1978);
M.A. Van Hove, S.Y. Tong: Surface Crystallography by DEED, Springer Ser. Chem. Phys. Vol. 2 ( Springer, Berlin, Heidelberg, New York 1979 )
S.D. Kevan, D.H. Rosenblatt, D. Denley, B.-C. Lu, D.A. Shirley: Phys. Rev. Lett. 41, 1565 (1978);
C.H. Li, S.Y. Tong: Phys. Rev. Lett. 43, 526 (1979)
A.P. Hitchcock: Bibliography of Atomic and Molecular Inner Shell Excitation Studies, J. Electron Spectrosc. 25, 245 (1982)
V.I. Nefedov: J. Struct. Chem. 11, 277 (1970)
J.L. Dehmer: J. Chem. Phys. 56, 4496 (1972)
D. Dill, J.L. Dehmer: J. Chem. Phys. 61, 692 (1974)
F. Sette, J. Stöhr, A.P. Hitchcock: J. Chem. Phys. (to be published)
K. Bomben, C.J. Eyermann, W.L. Jolly: Jan. 18, 1983 update of A.A. Bakke, H.W. Chen, W.L. Jolly: J. Electron Spectrosc. 20, 333 (1980)
J. Stöhr, F. Sette: To be published
J. Stöhr, J.L. Gland, W. Eberhardt, D. Outka, R.J. Madix, F. Sette, R.J. Koestner, U. Döbler: Phys. Rev. Lett. 51, 2414 (1983)
J. Stöhr, C. Noguera, T. Kendelewicz: Phys. Rev. B (to be published)
R. Jaeger, J. Feldhaus, J. Haase, J. Stöhr, Z. Hussain, D. Menzel, D. Norman: Phys. Rev. Lett. 45, 1870 (1980)
J. Stöhr, R. Jaeger, J. Feldhaus, S. Brennan, D. Norman, G. Apai: Appl. Opt. 19, 3911 (1980)
J. Stöhr, D. Denley: In Proceedings, International Workshop on X-ray Instrumentation for Synchrotron Radiation,ed. by H. Winick, G.S. Brown. Stanford, April 1978, SSRL Report 78/04
D. Norman, J. Stöhr, R. Jaeger, P.J. Durham, J.B. Pendry: Phys. Rev. Lett. 51, 2052 (1983)
A.L. Johnson, E.L. Muetterties, J. Stöhr: J. Am. Chem. Soc. 105, 7183 (1983)
J. Stöhr, D. Outka, R.J. Madix, U. Doebler: Unpublished results
J. Stöhr, J.L. Gland, R.J. Koestner: Unpublished results
J. Stöhr, R. Jaeger, T. Kendelewicz: Phys. Rev. Lett. 49, 142 (1982)
G. Apai, J.F. Hamilton, J. Stöhr, A. Thompson: Phys. Rev. Lett. 43, 165 (1979)
P.H. Citrin, J.E. Rowe, P. Eisenberger: Phys. Rev. B28, 2299 (1983)
J. Stöhr, R. Jaeger: J. Vac. Sci. Technol. 21, 619 (1982)
G. Rossi, R. Jaeger, J. Stöhr, T. Kendelewicz, I. Lindau: Phys. Rev. B27, 5154 (1983)
J. Stöhr, R. Jaeger, G. Rossi, T. Kendelewicz, I. Lindau: Surf. Sci. 134, 813 (1983)
C.R. Brundle: In Aspects of the Kinetics and Dynamics of Surface Reac-tions — 1979, ed. by U. Landman, AIP Conference Proceedings No. 61 ( American Institute of Physics, New York 1980 )
J.F. Hamilton, R.C. Baetzold: Science 205, 1213 (1979)
W.D. Buckley, S.C. Moss: Solid State Electron. 15, 1331 (1972)
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1984 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Stöhr, J. (1984). Surface Crystallography by Means of SEXAFS and NEXAFS. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces V. Springer Series in Chemical Physics, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82253-7_10
Download citation
DOI: https://doi.org/10.1007/978-3-642-82253-7_10
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-82255-1
Online ISBN: 978-3-642-82253-7
eBook Packages: Springer Book Archive