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Ultrafast Scanning Tunneling Microscopy Using a Photoexcited Low-Temperature-Grown GaAs Tip

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Ultrafast Phenomena XI

Abstract

We report ultrafast scanning tunneling microscopy using a low-temperature- grown GaAs tip photoexcited by 100-fs, 800-nm pulses. We use this tip to detect picosecond transients on a coplanar stripline and demonstrate a temporal resolution of 1.7 ps. A dependence of the transient signal upon spatial position of the tip is revealed, indicating that the signal arises from areas on the sample smaller than ~20nm

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© 1998 Springer-Verlag Berlin Heidelberg

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Donati, G.P., Rodriguez, G., Taylor, A.J. (1998). Ultrafast Scanning Tunneling Microscopy Using a Photoexcited Low-Temperature-Grown GaAs Tip. In: Ultrafast Phenomena XI. Springer Series in Chemical Physics, vol 63. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72289-9_48

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  • DOI: https://doi.org/10.1007/978-3-642-72289-9_48

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-72291-2

  • Online ISBN: 978-3-642-72289-9

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