Abstract
Unequal Error Control (UEC) codes provide means for handling errors where the codeword digits may be exposed to different error rates, like in two-dimensional optical storage media, or VLSI circuits affected by intermittent faults or different noise sources. However, existing UEC codes are quite rigid in their definition. They split codewords in only two areas, applying different (but limited) error correction functions in each area. This paper introduces Flexible UEC (FUEC) codes, which can divide codewords into any required number of areas, establishing for each one the adequate error detection and/or correction levels. At design time, an algorithm automates the code generation process. Among all the codes meeting the requirements, different selection criteria can be applied. The code generated is implemented using simple logic operations, allowing fast encoding and decoding. Reported examples show their feasibility and potentials.
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References
Fujiwara, E.: Code Design for Dependable Systems. John Wiley & Sons (2006)
Constantinescu, C.: Intermittent faults and effects on reliability of integrated circuits. In: Reliability and Maintainability Symposium (RAMS 2008), pp. 370–374 (January 2008)
Nightingale, E.B., Douceur, J.R., Orgovan, V.: Cycles, cells and platters: an empirical analysis of hardware failures on a million consumer PCs. In: Procs. ECCS (April 2011)
Chou, W., Neifeld, M.: Interleaving and error correction in volume holographic memory systems. Applied Optics 37(29), 6951–6968 (1998)
Namba, K.: Unequal error control codes with two-level burst and bit error correcting capabilities. Electr. Comm. Japan III: Fund. Electronics Science 87, 21–29 (2004)
Gil, P., et al.: Fault Representativeness. Deliverable ETIE2 of Dependability Benchmarking Project. IST-2000-25245 (2002)
Neubauer, A., Freudenberger, J., Kühn, V.: Coding Theory: Algorithms, Architectures and Applications. John Wiley & Sons (2007)
LaBel, K.A.: Proton single event effects (SEE) guideline, NEPP Program web site (August 2009), https://nepp.nasa.gov/files/18365/Proton_RHAGuide_NASAAug09.pdf
Constantinescu, C.: Trends and challenges in VLSI circuit reliability. IEEE Micro. 23(4), 14–19 (2003)
Shamshiri, S., Cheng, K.T.: Error-Locality-Aware Linear Coding to Correct Multi-bit Upsets in SRAMs. In: IEEE International Test Conference, pp. 1–10 (November 2010)
Masnick, B., Wolf, J.: On linear unequal error protection codes. IEEE Transactions on Information Theory 13(4), 600–607 (1967)
Dutta, A., Touba, N.A.: Reliable network-on-chip using a low cost unequal error protection code. In: Procs. DFT, pp. 3–11 (September 2007), doi:10.1109/DFT.2007.20
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Saiz-Adalid, LJ., Gil-Vicente, PJ., Ruiz-García, JC., Gil-Tomás, D., Baraza, J.C., Gracia-Morán, J. (2013). Flexible Unequal Error Control Codes with Selectable Error Detection and Correction Levels. In: Bitsch, F., Guiochet, J., Kaâniche, M. (eds) Computer Safety, Reliability, and Security. SAFECOMP 2013. Lecture Notes in Computer Science, vol 8153. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-40793-2_17
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DOI: https://doi.org/10.1007/978-3-642-40793-2_17
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-40792-5
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