Abstract
Current integration scales are increasing the number and types of faults that embedded systems must face. Traditional approaches focus on dealing with those transient and permanent faults that impact the state or output of systems, whereas little research has targeted those faults being logically, electrically or temporally masked -which we have named fugacious. A fast detection and precise diagnosis of faults occurrence, even if the provided service is unaffected, could be of invaluable help to determine, for instance, that systems are currently under the influence of environmental disturbances like radiation, suffering from wear-out, or being affected by an intermittent fault. Upon detection, systems may react to adapt the deployed fault tolerance mechanisms to the diagnosed problem. This paper explores these ideas evaluating challenges and requirements involved, and provides an outline of potential techniques to be applied.
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Espinosa, J., de Andrés, D., Ruiz, JC., Gil, P. (2013). The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs. In: Vieira, M., Cunha, J.C. (eds) Dependable Computing. EWDC 2013. Lecture Notes in Computer Science, vol 7869. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-38789-0_7
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DOI: https://doi.org/10.1007/978-3-642-38789-0_7
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