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LCD Processing and Testing

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  • First Online:
Handbook of Visual Display Technology

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Abstract

The TFT-LCD technology is based upon semiconductor IC fabrication processing. The unique point of the TFT-LCD technology is that it uses a glass substrate, instead of the conventional Si wafer. For the TFT fabrication process, thin-film formation, such as CVD, sputtering, and film coating on glass substrate are important. In the assembling process of color filter and TFT substrate, photo spacer and ODF have been developed and applied for large-size LCDs. Light source of backlight is being replaced from CCFL by LED. Test and repair technologies have been essential technologies for stable production. As described in this chapter, these technologies are contributing to realize good yield for large-size display fabrication.

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Abbreviations

ACF:

Anisotropic conductive film

AOI:

Automatic optical inspection system

a-Si:

Amorphous silicon

BM:

Black matrix

CCFL:

Cold cathode fluorescent lamp

CF:

Color filter

CDO:

Critical dimension and overlay measurement

COF:

Chip on film

COG:

Chip on glass

CVD:

Chemical vapor deposition

FHG:

Fourth harmonic generation

FPC:

Flexible printed circuit board

ITO:

Indium tin oxide

LCD:

Liquid crystal display

LED:

Light-emitting diode

MVA:

Multi-domain vertical alignment

NTSC:

National television system committee (body that develops television standards)

OD:

Optical density

ODF:

One drop fill

OLB:

Out lead bonder

PE-CVD:

Plasma-enhanced chemical vapor deposition

PET:

Polyethylene terephthalate

p-Si:

Polycrystalline silicon

PVA:

Polyvinyl alcohol

SiNx:

Silicon nitride

TAB:

Tape-automated bonding

TAC:

Triacetyl cellulose

TFT:

Thin-film transistor

THG:

Third harmonic generation

μe:

Electron field-effect mobility

YAG:

Yttrium aluminum garnet

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Authors and Affiliations

  1. Display Technology Laboratories, Corporate R &D group, Sharp Corporation, 2613-1, Ichinomoto-cho, 632-8567, Tenri, Nara, Japan

    Yoshitaka Yamamoto

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  1. Yoshitaka Yamamoto
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Correspondence to Yoshitaka Yamamoto .

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Editors and Affiliations

  1. Industrial Technology Research Institute Display Technology Center, Hsin Chu, Taiwan

    Janglin Chen

  2. Nottingham Trent University School of Computing & Informatics, Nottingham, United Kingdom

    Wayne Cranton

  3. Veritas et Visus, Temple, TX, USA

    Mark Fihn

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Yamamoto, Y. (2015). LCD Processing and Testing. In: Chen, J., Cranton, W., Fihn, M. (eds) Handbook of Visual Display Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-35947-7_98-2

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  • DOI: https://doi.org/10.1007/978-3-642-35947-7_98-2

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Online ISBN: 978-3-642-35947-7

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