Abstract
The chapter starts with a discussion of limitations of Bragg diffraction. Local structural methods such as x-ray absorption spectroscopy and total scattering are introduced as well as methods to investigate the electronic structure. Methods of structural modelling are also discussed.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
L.B. McCusker, R.B. Von Dreele, D.E. Cox, D. Louer, P. Scardi, J. Appl. Cryst. 32, 36 (1999)
B. Cullity, S. Stock, Elements of X-ray Diffraction (Addison-Wesley, Reading, 1978)
S. Hosokawa, N. Happo, K. Hayashi, Phys. Rev. B 80, 134123 (2009)
J.C. Mikkelsen, J.B. Boyce, Phys. Rev. Lett. 49, 1412 (1982)
T. Egami, S.J.L. Billinge, Underneath the Bragg Peaks: Structural Analysis of Complex Materials (Pergamon, Oxford, 2003)
C. Kittel, Introduction to Solid State Physics, 7th edn. (Wiley, New York, 1996)
G. Bunker, Introduction to XAFS: A Practical Guide to X-ray Absorption Fine Structure Spectroscopy (Cambridge University Press, Cambridge, 2010)
B. Ravel, M. Newville, J. Synch. Rad. 12, 537 (2005)
S.J. Gurman, R.L. McGreevy, J. Phys. Condens. Matter 2, 9463 (1990)
R. McGreevy, J. Phys. Condens. Matter 13, R877 (2001)
G. Smolentsev, A.V. Soldatov, M.C. Feiters, Phys. Rev. B 75, 144106 (2007)
A.L. Ankudinov, B. Ravel, J.J. Rehr, S.D. Conradson, Phys. Rev. B 58, 7565 (1998)
J.J. Rehr, R.C. Albers, Rev. Mod. Phys 72, 621 (2000)
J.J. Rehr, J.J. Kas, F.D. Vila, M.P. Prange, K. Jorissen, Phys. Chem. Chem. Phys. 12, 5503 (2010)
H. Stragier, J.O. Cross, J.J. Rehr, L.B. Sorensen, C.E. Bouldin, J.C. Woicik, Phys. Rev. Lett. 69, 3064 (1992)
A.I. Frenkel, A.V. Kolobov, I.K. Robinson, J.O. Cross, Y. Maeda, C.E. Bouldin, Phys. Rev. Lett. 89, 285503 (2002)
A. Hirata, P. Guan, T. Fujita, Y. Hirotsu, A. Inoue, A. Yavari, T. Sakurai, M. Chen, Nature Mater. 10, 28 (2011)
J.J. Kim, K. Kobayashi, E. Ikenaga, M. Kobata, S. Ueda, T. Matsunaga, K. Kifune, R. Kojima, N. Yamada, Phys. Rev. B 76, 115124 (2007)
A.V. Kolobov, A. Rogalev, F. Wilhelm, N. Jaouen, T. Shima, J. Tominaga, Appl. Phys. Lett. 84, 1641 (2004)
S.R. Elliott, Physics of Amorphous Materials, 2nd edn. (Longman, London, 1984)
S. Yamasaki, Philos. Mag. B 56, 79 (1987)
W.E. Spear, Proc. Phys. Soc. 76, 826 (1960)
W.E. Spear, Proc. Phys. Soc. B 70, 669 (1957)
A.V. Kolobov, J. Non-Cryst. Solids 198, 728 (1996)
R.L. McGreevy, L. Pusztai, Mol. Simul. 1, 359 (1988)
P. Jovari, I. Kaban, J. Steiner, B. Beuneu, A. Schops, M.A. Webb, Phys. Rev. B 77, 035202 (2008)
J. Akola, R.O. Jones, S. Kohara, S. Kimura, K. Kobayashi, M. Takata, T. Matsunaga, R. Kojima, N. Yamada, Phys. Rev. B 80, 020201 (2009)
S. King, Nature 213, 1112 (1967)
L. Guttman, J. Non-Cryst. Solids 116, 145 (1990)
R.M. Martin, Electronic Structure: Basic Theory and Practical Methods (Cambridge University Press, Cambridge, 2004)
W. Welnic, in Phase Change Materials: Science and Applications, ed. by S. Raoux, M. Wuttig (Springer Science + Business Media, Berlin, 2009), p. 17
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2012 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Kolobov, A.V., Tominaga, J. (2012). Methods of Structure Analysis. In: Chalcogenides. Springer Series in Materials Science, vol 164. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-28705-3_3
Download citation
DOI: https://doi.org/10.1007/978-3-642-28705-3_3
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-28704-6
Online ISBN: 978-3-642-28705-3
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)