Abstract
A Bayesian plan of reliability qualification test is discussed in combination with the results obtained from the actual tests. On the premise that the test sample size is quantitative, a scheme of reliability qualification test in binomial case is formulated by using prior information efficiently. From the view of the meaning posterior risk actually concerned by users and producers, the difference and connection between the Bayes reliability qualification test and evaluation scheme has been analyzed, which could be the guidance for test scheme selection.
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© 2012 Springer Berlin Heidelberg
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Ren, Z., Ming, Z. (2012). Analysis of Test Scheme for a Bayesian Plan of Qualification Test in Binomial Case. In: Jin, D., Lin, S. (eds) Advances in Electronic Engineering, Communication and Management Vol.2. Lecture Notes in Electrical Engineering, vol 140. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-27296-7_7
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DOI: https://doi.org/10.1007/978-3-642-27296-7_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-27295-0
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