Skip to main content
SpringerLink
Log in

A Statistical Characterization of Resonant Electromagnetic Interactions with Thin Wires: Variance and Kurtosis Analysis

  • Conference paper
  • First Online:
Scientific Computing in Electrical Engineering SCEE 2008

Part of the book series: Mathematics in Industry ((TECMI,volume 14))

Abstract

A statistical characterization of random electromagnetic interactions affected by resonances is presented. It hinges on the analysis of the variance and the kurtosis to assess the intensity of the resonances. The method is illustrated by the study of a randomly varying thin wire modeled by a Pocklington integral equation.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Brown, G.S.: A stochastic Fourier transform approach to scattering from perfectly conducting randomly rough surfaces. IEEE Trans. Ant. Prop. AP-30(6), 1135–1144 (1982)

    Article  Google Scholar 

  2. Hill, D.: Plane wave integral representation for fields in reverberation chambers. IEEE Trans. EMC. 40(3), 209–217 (1998). DOI 10.1109/15. 709418

    Google Scholar 

  3. Bellan, D., Pignari, S.: A probabilistic model for the response of an electrically short two-conductor transmission line driven by a random plane wave field. IEEE Trans. EMC. 43(2), 130–139 (2001). DOI 10. 1109/15.925532

    Google Scholar 

  4. Michielsen, B.L.: Probabilistic modelling of stochastic interactions between electromagnetic fields and systems. Comptes Rendus de l’Académie des sciences: Physique 7, 543–559 (2006)

    Article  Google Scholar 

  5. Sy, O., Vaessen, J., van Beurden, M., Tijhiuis, A., Michielsen, B.: Probabilistic study of the coupling between deterministic electromagnetic fields and a stochastic thin-wire over a pec plane. In: Proc. International Conference on Electromagnetics in Advanced Applications ICEAA 2007, pp. 637–640 (2007). DOI 10.1109/ICEAA. 2007.4387382

    Article  Google Scholar 

  6. De Roo, R., Misra, S., Ruf, C.: Sensitivity of the kurtosis statistic as a detector of pulsed sinusoidal rfi. IEEE Trans. on Geoscience and Remote Sensing 45(7), 1938–1946 (2007). DOI 10.1109/TGRS.2006.888101

    Article  Google Scholar 

  7. Michielsen, B.L.: A new approach to electromagnetic shielding. In: Proc. Int. Zürich EMC Symp. 1985, pp. 509–514 (1985)

    Google Scholar 

  8. Mrozynski, G., Schulz, V., Garbe, H.: A benchmark catalog for numerical field calculations with respect to emc problems. In: Proc. IEEE Int. EMC Symp., vol. 1, pp. 497–502 (1999)

    Google Scholar 

  9. Feller, W.: An introduction to probability theory and its applications. Wiley and sons (1971)

    MATH  Google Scholar 

  10. Bungartz, H.J., Griebel, M.: Sparse grids. Acta Numerica pp. 1–123 (2004)

    MathSciNet  Google Scholar 

  11. Krommer, A.R., Ueberhuber, C.W.: Computational Integration. SIAM (1998)

    Google Scholar 

  12. Gerstner, T., Griebel, M.: Numerical integration using sparse grids. Numerical Algorithms 18 (24)(3-4), 209–232 (1998)

    Article  MATH  MathSciNet  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Eindhoven University of Technology, Den Dolech 2, 5600, MB, Eindhoven, The Netherlands

    O. O. Sy, M. C. van Beurden, J. A. H. M. Vaessen & A. G. Tijhuis

  2. ONERA, 2, av E. Belin, 31055, Toulouse Cedex, France

    B. L. Michielsen

Authors
  1. O. O. Sy
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. M. C. van Beurden
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. B. L. Michielsen
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. J. A. H. M. Vaessen
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. A. G. Tijhuis
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to O. O. Sy .

Editor information

Editors and Affiliations

  1. , Faculty of Electronics, Communications a, Aalto University School of Science and T, AALTO, 00076, Finland

    Janne Roos

  2. , Faculty of Electronics, Communications a, Aalto University School of Science and T, AALTO, 00076, Finland

    Luis R.J. Costa

Rights and permissions

Reprints and permissions

Copyright information

© 2010 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Sy, O.O., van Beurden, M.C., Michielsen, B.L., Vaessen, J.A.H.M., Tijhuis, A.G. (2010). A Statistical Characterization of Resonant Electromagnetic Interactions with Thin Wires: Variance and Kurtosis Analysis. In: Roos, J., Costa, L. (eds) Scientific Computing in Electrical Engineering SCEE 2008. Mathematics in Industry(), vol 14. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-12294-1_16

Download citation

Publish with us

Policies and ethics

Search

Navigation