Description of electron microscope image details based on structure relaxations with enhanced interaction potentials

Abstract

The imaging of crystal defects by transmission electron microscopy (high resolution HRTEM or conventional bright- or dark-field TEM) is well known and routinely used. Although the image calculations always tend to establish standard rules of interpretation, a direct phenomenological analysis of electron micrographs is mostly not possible, thus requiring the application of image matching techniques by calculating both the Fourier imaging including the microscope aberrations and the interaction process. Especially for the latter good structure models are necessary.