Abstract
The combination of strain measurements1 and the analysis of High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) images constitutes a powerful approach to investigate strained heterostructures on the nanometer scale and has proved to be extremely powerful for characterizing nanomaterials2,3.
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Galindo, P., Pizarro, J., Rosenauer, A., Yáñez, A., Guerrero, E., Molina, S.I. (2008). HAADF-STEM image simulation of large scale nanostructures. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_56
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DOI: https://doi.org/10.1007/978-3-540-85156-1_56
Publisher Name: Springer, Berlin, Heidelberg
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