Abstract
By using Zernike-type phase plates, suitably located within the microscope column, the object phase is transferred into the image amplitude and, hence, image intensity. Information transfer relies on controlled phase shifting of all diffracted beams while leaving the transmitted beam unaltered [1]. The advent of viable electron-optical phase shifting elements [2] paved the way to experimental practice. To interpret correctly the recorded intensity profiles and reveal phase information, it is essential to rely on a simple expression for computing the image intensity associated to phase objects.
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References
F. Zernike, Physica 9 (1942), p. 686; Physica 9 (1942), p. 974.
S.-H. Huang et al., J. Electron Microsc. 55 (2006), p. 273.
M. Born and E. Wolf, Principles of Optics, 6th ed., Pergamon Press (1980), p. 427.
M. Beleggia, Ultramicroscopy (2008) submitted.
I gratefully acknowledge the Royal Society for financial support.
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Beleggia, M. (2008). The image intensity in Zernike mode with electrons. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_39
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DOI: https://doi.org/10.1007/978-3-540-85156-1_39
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