Abstract
Electron energy-loss spectroscopy (EELS) combined with a scanning transmission electron microscopy (STEM) is a powerful tool to analyze electronic structure in local area such as interfaces and defects. Here we report the study on local analysis of BaTiO3 (BTO)/SrTiO3 (STO) interfaces using STEM-EELS method. The influence of residual strain due to the lattice mismatch between the film and the substrate on the electronic structure is investigated.
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References
M. Kawai, D. Kan, S. Isojima, H. Kurata, S. Isoda and Y. Shimakawa, J. Appl. Phys. 102 (2007) 114311.
K. Kurata, S. Isoda and T. Tomita, Proc. of IMC16, p.583, 2006.
We acknowledge to Mrs. Kawasaki, Otsuka and Miss. Nishimura of TRC for preparing the cross-section samples.
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Kurata, H., Kozawa, R., Kawai, M., Shimakawa, Y., Isoda, S. (2008). Local Analysis of BaTiO3/SrTiO3 interfaces by STEM-EELS. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_202
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DOI: https://doi.org/10.1007/978-3-540-85156-1_202
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-85154-7
Online ISBN: 978-3-540-85156-1
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