Abstract
Recent advances in aberration-correcting electron optics have led to increased resolution, sensitivity and signal to noise in atomic resolution microscopy. Building on these developments, the TEAM project was designed to optimize the electron microscope around aberration-corrected electron optics and to further advance the limits of the instrument and the technique [1]. The vision for the TEAM project is the idea of providing a sample space for electron scattering experiments in a tunable electron optical environment by removing some of the constraints that have limited electron microscopy until now. The resulting improvements in resolution, the increased space around the sample, and the possibility of exotic electron-optical settings will enable new types of experiments. The TEAM microscope will feature unique corrector elements for spherical and chromatic aberrations, a novel AFM-inspired specimen stage, a high-brightness gun and numerous other innovations that will extend resolution down to the half-Angstrom level.
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References
Lawrence Berkeley National Laboratory, Argonne National Laboratory, Oak Ridge National Laboratory and the FSMRL at the University of Illinois. For more details, see http://ncem.lbl.gov/TEAM-project/index.html
C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, S. Uhlemann, H. Müller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E. A. Olson, T. Donchev, E.A. Kenik, A. Lupini, J. Bentley, S. Pennycook, I.M. Anderson, A.M. Minor, A.K. Schmid, T. Duden, V. Radmilovic, Q. Ramasse, M. Watanabe, R. Erni, E.A. Stach, P. Denes, U. Dahmen, submitted for publication. See also other presentations at this meeting.
The TEAM project is supported by the Department of Energy, Office of Science, Basic Energy Sciences. NCEM is supported under Contract # DE-AC02-05CH11231.
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© 2008 Springer-Verlag Berlin Heidelberg
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Dahmen, U. et al. (2008). An update on the TEAM project — first results from the TEAM 0.5 microscope, and its future development. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_2
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DOI: https://doi.org/10.1007/978-3-540-85156-1_2
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