Abstract
The matrix Δ in (A.5) does not depend on z if the medium is homogeneous, i.e., ɛ is not a function of z. The solution of (A.2) for a layer with thickness d defines the partial transfer matrix Tp for dielectric homogeneous films
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Schubert, M. 4 × 4 Transfer Matrix T p for Dielectric Homogeneous Films. In: Infrared Ellipsometry on Semiconductor Layer Structures. Springer Tracts in Modern Physics, vol 209. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44701-6_10
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DOI: https://doi.org/10.1007/978-3-540-44701-6_10
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Publisher Name: Springer, Berlin, Heidelberg
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Online ISBN: 978-3-540-44701-6
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