Abstract
The aim of 3DXRD is to characterize the crystallographic lattice as function of position within the bulk of a specimen. Locally, the lattice is uniquely determined by its six lattice parameters (a, b, c, α, β, γ) and its orientation in space. In most of this book it will be assumed that the structural phase is known, but that the lattice can be subject to stress. The associated elastic strain causes a perturbation of the lattice parameters from the strain-free, reference values. ...
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F. Poulsen, H. Geometric Principles. In: Three-Dimensional X-Ray Diffraction Microscopy. Springer Tracts in Modern Physics, vol 205. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44483-1_3
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DOI: https://doi.org/10.1007/978-3-540-44483-1_3
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