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Phase Contrast X-Ray Microscopy — Experiments at the BESSY Storage Ring

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Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 56))

Abstract

Up to the end of 1986 it was always stated that to a good approximation soft x-ray photons participate in only one reaction with matter, i.e. absorption of the photon in an atom, because the atomic cross sections for inelastic and elastic scattering are 4 to 5 orders of magnitude smaller than the atomic cross section for photoelectric absorption. But this is only half the truth.

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References

  1. B.L. Henke, P. Lee, T.J. Tanaka, R.L. Shimabukuro, B.K. Fujikawa: “The Atomic Scattering Factor, fl + i f2, for 94 Elements and for the 100 to 2000 eV photon energy region”, in: Low Energy X-Ray Diagnostics–1981, ed. by D.T. Attwood and B.L. Henke, AIP Conf. Proc. No. 75, p. 340–388 (1981)

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  2. G. Schmahl, D. Rudolph: “Proposal for a Phase Contrast X-Ray Microscope”, in: X-Ray Microscopy - Instrumentation and Biological Applications, ed. by P.C. Cheng and G.J. Jan (Springer, Berlin, Heidelberg), in press

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  3. D. Rudolph, B. Niemann, G. Schmahl and O. Christ: “The Göttingen X-Ray Microscope and X-Ray Microscopy Experiments at the BESSY Storage Ring”,ed. by G. Schmahl and D. Rudolph, Springer Series in Optical Sciences, Vol. 43 (Springer, Berlin, Heidelberg, 1984 ) p. 192–202

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  4. N.G. Nyakatura, W. Meyer-Ilse, P. Guttmann, B. Niemann, D. Rudolph, G. Schmahl, V. Sarafis, N. Hertel, E. Uggerh4j, E. Skriver, J.O.R. N¢rgaard and A.B. Maunsbach:“Investigations of Biological Specimens with the X-Ray Microscope at BESSY”, this volume

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  5. F. Zernike: “Das Phasenkontrastverfahren bei der mikroskopischen Beobachtung”, Zeitschr. f. techn. Physik, Nr. 11, p. 454–457 (1935)

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  6. H. Beyer “Theorie und Praxis des Phasenkontrastverfahrens” Akademische Verlagsgesellschaft, Frankfurt a.M. (1965)

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© 1988 Springer-Verlag Berlin Heidelberg

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Schmahl, G., Rudolph, D., Guttmann, P. (1988). Phase Contrast X-Ray Microscopy — Experiments at the BESSY Storage Ring. In: Sayre, D., Kirz, J., Howells, M., Rarback, H. (eds) X-Ray Microscopy II. Springer Series in Optical Sciences, vol 56. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-39246-0_40

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  • DOI: https://doi.org/10.1007/978-3-540-39246-0_40

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-14490-9

  • Online ISBN: 978-3-540-39246-0

  • eBook Packages: Springer Book Archive

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