Abstract
In chapter 4, we discuss the various types of image that can be formed in the transmission electron microscope, starting with an analysis of the interaction between a primary electron and an atomic nucleus. Different kinds of specimen are then considered, including crystalline samples whose diffraction patterns can yield useful information about their atomic structure.
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© 2016 Springer International Publishing Switzerland
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Egerton, R.F. (2016). TEM Specimens and Images. In: Physical Principles of Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-319-39877-8_4
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DOI: https://doi.org/10.1007/978-3-319-39877-8_4
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Publisher Name: Springer, Cham
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Online ISBN: 978-3-319-39877-8
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