Abstract
Femtosecond pump-probe microscopy is used to directly visualize the diffusion of photogenerated charge carriers in undoped silicon nanowires, as well as charge separation in a nanowire encoded with an axial p-type/intrinsic/n-type (p-i-n) junction.
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References
Gabriel, M. M.; Kirschbrown, J. R.; Christesen, J. D.; Pinion, C. W.; Zigler, D. F.; Grumstrup, E. M.; Mehl, B. P.; Cating, E. E. M.; Cahoon, J. F.; Papanikolas, J. M. Nano Lett., 13, 1336-1340 (2013).
Gabriel, M. M.; Grumstrup, E. M.; Kirschbrown, J. R.; Pinion, C. W.; Christesen, J. D.; Zigler, D. F.; Cating, E. E.; Cahoon, J. F.; Papanikolas, J. M. Nano Lett., 14, 3079 (2014).
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Funding for this project was provided by the National Science Foundation under awards CHE-1213379 (J.M.P.) and DMR-1308695 (J.F.C.).
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Gabriel, M.M. et al. (2015). Visualization of Charge Carrier Motion in Semiconductor Nanowires with Ultrafast Pump-Probe Microscopy. In: Yamanouchi, K., Cundiff, S., de Vivie-Riedle, R., Kuwata-Gonokami, M., DiMauro, L. (eds) Ultrafast Phenomena XIX. Springer Proceedings in Physics, vol 162. Springer, Cham. https://doi.org/10.1007/978-3-319-13242-6_165
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DOI: https://doi.org/10.1007/978-3-319-13242-6_165
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