Skip to main content

Application of Reliability Growth Model in Step-Down Stress Accelerated Storage Test

  • Conference paper
  • First Online:
Engineering Asset Management - Systems, Professional Practices and Certification

Part of the book series: Lecture Notes in Mechanical Engineering ((LNME))

  • 3596 Accesses

Abstract

Step-down accelerated storage test is equalled to reliability growth, a method of step-down stress accelerated storage test based Army Materiel System Analysis Activity (AMSAA) model is proposed, according to the step-down stress, the mean time between failures (MTBF) under normal stress can be obtained, by using the AMSAA model. First, through the product’s cumulative failure time, cumulative failure numbers and based on AMSAA model, the product’s instantaneous MTBF is shown. Then the step-down stress is divided into n ladders, and there is only one fault under each stress, the joint probability density function is shown by the cumulative failure time of each step-down stress, and the parameters of the AMSAA model are estimated by the maximum likelihood estimation, then the point estimation of the product’s instantaneous MTBF is got. By choosing instantaneous MTBF of certain accelerated stresses and combined respective physical accelerated model, the product’s storage lifetime is estimated. Finally, a case study is performed using this method. The effectiveness of this method is shown, for the point estimation of each parameter is little different. Thus it provides a new evaluation method for step-down accelerated storage test.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 259.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 329.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Nelson W (1980) Member ASQC. Accelerated life testing-step-stress models and data analysis. IEEE Trans Reliab 63(2):103–108

    Google Scholar 

  2. Zhang CH, Chen X, Wen XS (2005) Step-down-stress Accelerated Life Testing-Methodology. Acta Armamentaril 26(5):661–665

    Google Scholar 

  3. Zhang CH, Chen X, Wen XS (2005) Step-down-stress Accelerated Life Testing-Statistical analysis. Acta Armamentaril 26(5):666–669

    Google Scholar 

  4. Wang YS, Zhang CH, Chen X (2007) Step-down-stress accelerated life testing-optimal design. Acta Armamentaril 28(6):686–690

    Google Scholar 

  5. Tan W, Shun YM, Sun YD (2011) Reliability simulation for step-down-stress accelerated life testing. Computer Simulation 28(12):80–83

    Google Scholar 

  6. Xu G, Wang RH (2008) Efficiency analysis of the step-down-stress accelerated life testing. J Shanghai Norm Univ 37(5):468–475

    Google Scholar 

  7. Ye DZ (2000) Reliability enhancement test. In: Tenth annual conference of the Chinese institute of electronics reliability branch, pp 40–48

    Google Scholar 

  8. IEC/TC56 (1989) Draft, reliability growth models and estimation method

    Google Scholar 

  9. Green JE (1973) The problems of reliability growth and demonstration with military electronics. Microelectr Reliab 12:513–520

    Article  Google Scholar 

  10. GJB1407-92 (1992) Reliability growth test

    Google Scholar 

  11. Crow L H. AMSAA reliability growth symposium. ADA027053, 1974

    Google Scholar 

  12. Zhao Y, Yang J, Ma XB (2009) Data analysis of reliability. Beihang University Press, Beijing, pp 234–235

    Google Scholar 

  13. He GW, Dai CZ (2003) Reliability testing technique. National Defence Industry Press, Beijing, pp 159–163

    Google Scholar 

  14. Mao SS, Wang LL (1995) Accelerated life test. Science Press, Beijing, pp 18–19

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to XiaoGang Li .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2015 Springer International Publishing Switzerland

About this paper

Cite this paper

Wang, Y., Li, X., Qin, T. (2015). Application of Reliability Growth Model in Step-Down Stress Accelerated Storage Test. In: Tse, P., Mathew, J., Wong, K., Lam, R., Ko, C. (eds) Engineering Asset Management - Systems, Professional Practices and Certification. Lecture Notes in Mechanical Engineering. Springer, Cham. https://doi.org/10.1007/978-3-319-09507-3_117

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-09507-3_117

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-09506-6

  • Online ISBN: 978-3-319-09507-3

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics