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Multipacting Related Processes and RF Breakdown Protection by Using Bias Pulsing at the Nevis Synchrocyclotron

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Seventh International Conference on Cyclotrons and their Applications

Part of the book series: Experientia Supplementum ((EXS,volume 24))

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Abstract

Instantaneous DC conduction currents of biased electrodes during multipacting were measured and multipacting related processes are discussed. It is shown that by pulsing the dee bias instead of keeping it steady, several important advantages may be gained with respect to RF amplitude buildup and discharge prevention and quenching. The breakdown protection system using bias pulsing in operation at the Nevis Synchrocyclotron is presented.

Research supported by the National Science Foundation.

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References

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Author information

Authors and Affiliations

  1. Nevis Laboratories, Columbia University, Irvington, N.Y., 10533, USA

    F. G. Tinta

Authors
  1. F. G. Tinta
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Editor information

Editors and Affiliations

  1. SIN, Switzerland

    W. Joho (Chairman) (Chairman)

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© 1975 Springer Basel AG

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Tinta, F.G. (1975). Multipacting Related Processes and RF Breakdown Protection by Using Bias Pulsing at the Nevis Synchrocyclotron. In: Joho, W. (eds) Seventh International Conference on Cyclotrons and their Applications. Experientia Supplementum, vol 24. Birkhäuser, Basel. https://doi.org/10.1007/978-3-0348-5520-4_28

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  • DOI: https://doi.org/10.1007/978-3-0348-5520-4_28

  • Publisher Name: Birkhäuser, Basel

  • Print ISBN: 978-3-0348-5522-8

  • Online ISBN: 978-3-0348-5520-4

  • eBook Packages: Springer Book Archive

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