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Fault Removal Efficiency: A Key Driver in Software Reliability Growth Modeling

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Reliability Engineering for Industrial Processes

Part of the book series: Springer Series in Reliability Engineering ((RELIABILITY))

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Abstract

In the contemporary landscape of software development, the significance of software reliability cannot be overstated. With the escalating complexity and widespread integration of software systems across diverse domains, ensuring their dependability has emerged as a paramount concern. Software reliability growth models (SRGMs) play a crucial role in assessing and improving the reliability of software systems. These models provide a quantitative framework for understanding the evolution of faults and predicting the reliability of software during its development lifecycle, and illuminate the consequential enhancement in overall reliability over time. Central to this exploration is the concept of fault removal efficiency (FRE), quantifying the proportion of bugs eradicated through meticulous reviews, inspections, and testing processes. As a critical determinant of software quality and process management, FRE provides developers with invaluable insights into testing efficacy and aids in predicting additional efforts required. The chapter explores some SRGMs that incorporate FRE, providing readers with a comprehensive insight into how FRE shapes the dynamics of the SRGM.

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Authors and Affiliations

  1. Department of Engineering Sciences, ABV-IIITM, Gwalior, India

    Umashankar Samal & Ajay Kumar

Authors
  1. Umashankar Samal
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  2. Ajay Kumar
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Corresponding author

Correspondence to Umashankar Samal .

Editor information

Editors and Affiliations

  1. Amity Center for Interdisciplinary Research, Amity University, Noida, Uttar Pradesh, India

    P. K. Kapur

  2. Department of Industrial Engineering, Rutgers University, Piscataway, NJ, USA

    Hoang Pham

  3. Amity International Business School, Amity University, Noida, Uttar Pradesh, India

    Gurinder Singh

  4. Amity International Business School, Amity University, Noida, Uttar Pradesh, India

    Vivek Kumar

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Samal, U., Kumar, A. (2024). Fault Removal Efficiency: A Key Driver in Software Reliability Growth Modeling. In: Kapur, P.K., Pham, H., Singh, G., Kumar, V. (eds) Reliability Engineering for Industrial Processes. Springer Series in Reliability Engineering. Springer, Cham. https://doi.org/10.1007/978-3-031-55048-5_7

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  • DOI: https://doi.org/10.1007/978-3-031-55048-5_7

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-55047-8

  • Online ISBN: 978-3-031-55048-5

  • eBook Packages: EngineeringEngineering (R0)

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