Abstract
In this chapter, we consider the data from Figures 3, 6, and 14 in Kim and Lee (2004) as well as their Weibull analyses of these figures and analysis of their Figure 14. We use this data to see the role that the Weibull plays in their analysis, the physical interpretation of the Weibull shape and scale, and the BD formalism. In addition, other distributions are used to compare with the Weibull and to study the legitimacy of some of the BD formalism assumptions.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
The original data for Figures 3 and 6 of Kim and Lee’s is not available. The figures and analyses in Chapter 8 are based on data we constructed visually from Figures 3 and 6. We want to thank Professor Jack C. Lee for his efforts, though unsuccessful, in trying to provide the original data. We also want to thank Professor Jia-Liang Le for the cycles to failure data for Kim and Lee’s (2004) Figure 14; Le used this in his (2012) Figure 4 Weibull plots.
References
Kim, Y.-H., & Lee, J. C. (2004). Reliability characteristics of high-k dielectrics. Microelectronics Reliability, 44(2), 183–193.
Le, J.-L. (2012). A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress. Microelectronics Reliability, 52(1), 100–106.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2022 The Author(s), under exclusive license to Springer Nature Switzerland AG
About this chapter
Cite this chapter
Gleaton, J.U., Han, D., Lynch, J.D., Ng, H.K.T., Ruggeri, F. (2022). Statistical Analysis of Time-to-Breakdown Data. In: Fiber Bundles. Springer, Cham. https://doi.org/10.1007/978-3-031-14797-5_8
Download citation
DOI: https://doi.org/10.1007/978-3-031-14797-5_8
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-031-14796-8
Online ISBN: 978-3-031-14797-5
eBook Packages: Mathematics and StatisticsMathematics and Statistics (R0)