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Test and Reliability of Approximate Hardware

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Approximate Computing

Abstract

The undeniable need of energy efficiency in today’s devices is leading to the adoption of innovative computing paradigms—such as Approximate Computing. As this paradigm is gaining increasing interest, important challenges, as well as opportunities, arise concerning the dependability of those systems. This chapter will focus on test and reliability issues related to approximate hardware systems. It will cover problems and solutions concerning the impact of the approximation on hardware defect classification, test generation, and test application. Moreover, the impact of the approximation on the fault tolerance will be discussed, along with related design solutions to mitigate it.

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Authors and Affiliations

  1. University of Rennes, Inria, CNRS, IRISA, UMR 6074, Institut de Recherche en Informatique et Systèmes Aléatoires (IRISA), Rennes, France

    Marcello Traiola

  2. University of Lyon, Ecole Centrale Lyon, INSA Lyon, CNRS, UCBL, CPE Lyon, Lyon Institute of Nanotechnology (INL), Ecully, France

    Bastien Deveautour & Alberto Bosio

  3. Laboratory of Computer Science, Robotics and Microelectronics of Montpellier (LIRMM), University of Montpellier, French National Centre for Scientific Research (CNRS), Montpellier, France

    Patrick Girard & Arnaud Virazel

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  1. Nanjing University of Aeronautics and Astronautics, Nanjing, China

    Weiqiang Liu

  2. Northeastern University, Boston, MA, USA

    Fabrizio Lombardi

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Traiola, M., Deveautour, B., Bosio, A., Girard, P., Virazel, A. (2022). Test and Reliability of Approximate Hardware. In: Liu, W., Lombardi, F. (eds) Approximate Computing. Springer, Cham. https://doi.org/10.1007/978-3-030-98347-5_10

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