Abstract
In this chapter we provide a brief overview of the instrumentation used for three key optical characterization methods: spectroscopic ellipsometry, Raman spectroscopy, and photoluminescence. We also discuss the relationship between the optical properties determined by each method and the data obtained by the measurement equipment.
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Diebold, A., Hofmann, T. (2021). Instrumentation. In: Optical and Electrical Properties of Nanoscale Materials. Springer Series in Materials Science, vol 318. Springer, Cham. https://doi.org/10.1007/978-3-030-80323-0_3
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DOI: https://doi.org/10.1007/978-3-030-80323-0_3
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