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Introduction to Atom-Probe Tomography

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Atom-Probe Tomography

Abstract

This book describes both current atom-probe tomography (APT) practice and knowledge of related emission science. The atomic-level materials characterization technique of APT is currently the only technique able to detect individual atoms of all elements in a three-dimensional structure. Over the last decade, many major developments have raised APT to its present status as a routine characterization technique. This introductory chapter briefly describes the previous generations of atom probes and the technical developments that led to the modern state-of-the-art local electrode atom probe (LEAP®). The important ion emission process of field evaporation and the basics of field ion microscopy (FIM) are introduced. Some examples of APT characterization are also presented.

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Authors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, TN, USA

    Michael K. Miller

  2. Department of Electronic Engineering, University of Surrey, Guildford, Surrey, UK

    Richard G. Forbes

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Miller, M.K., Forbes, R.G. (2014). Introduction to Atom-Probe Tomography. In: Atom-Probe Tomography. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-7430-3_1

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