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Considerations on the Atomistics of Oxidation

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Kinetics of Reactions in Ionic Systems

Part of the book series: Materials Science Research ((MSR))

Abstract

Experiments were performed to determine the effect of structure on the mechanism of zirconium oxidation. It is shown that there is a high volume fraction of short circuit diffusion paths in the oxide formed on Zr in the temperature range 500–1000°C. The results of tracer experiments are in agreement with a short circuit diffusion mechanism. The assumption of line diffusion is shown to imply intuitively reasonable values of both the grain boundary thickness and the ratio of the line diffusion coefficient to the coefficient for lattice diffusion.

This work has been partially supported by the Advanced Research Projects Agency under Contract ARPA SD-88, and was submitted by J. B. L. in partial fulfillment of the requirements for the Ph.D. degree, Division of Engineering and Applied Physics, Harvard University.

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References

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Author information

Author notes

  1. J. B. Lightstone

    Present address: Linde Division, Union Carbide Corp., Tonawanda, New York, USA

Authors and Affiliations

  1. Division of Engineering and Applied Physics, Harvard University, Cambridge, Massachusetts, USA

    J. B. Lightstone

  2. Ledgemont Laboratory, Kennecott Copper Corporation, Lexington, Mass., USA

    J. B. Lightstone

  3. Linde Division, Union Carbide Corp., Tonawanda, New York, USA

    J. P. Pemsler

Authors
  1. J. B. Lightstone
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  2. J. P. Pemsler
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Editor information

Editors and Affiliations

  1. Atlantic Industrial Research Institute, Nova Scotia Technical College, Halifax, Nova Scotia, Canada

    T. J. Gray (Director) (Director)

  2. SUNY College of Ceramics, Alfred University, Alfred, New York, USA

    V. D. Fréchette

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© 1969 Springer Science+Business Media New York

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Lightstone, J.B., Pemsler, J.P. (1969). Considerations on the Atomistics of Oxidation. In: Gray, T.J., Fréchette, V.D. (eds) Kinetics of Reactions in Ionic Systems. Materials Science Research. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-6461-8_27

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  • DOI: https://doi.org/10.1007/978-1-4899-6461-8_27

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4899-6224-9

  • Online ISBN: 978-1-4899-6461-8

  • eBook Packages: Springer Book Archive

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