Abstract
General signal processing techniques for laboratory Raman spectroscopy and Remote Raman spectroscopy using cw and pulsed lasers are discussed. Chopped and pulsed source/time gated detection techniques are outlined. Detectors such as photomultiplier and image tubes, SEC Vidicon sensors, image dissectors, and multiplex spectrometers are discussed and some of their relative merits evaluated. Computer aided data reduction and techniques for fluorescence suppression in the signal and in the display are covered.
A brief comparison of signal processing systems for Remote Raman, Micro-Raman (spectra of single particles one micron in diameter) and other high background instrumental configurations are examined. Suitable references are detailed for further study of each of these topics.
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References
SSR Model 1120 Amplifier-Discriminator and 1105 Data Converter Manual, Solid State Radiations, Los Angeles, Calif. 1969, pp 2–1 through 2–10.
Ibid.
Simon Larach, “Photoelectronic Materials and Devices,” (D. Van Nostrand Company, Inc., New Jersey, 1965).
RCA Photomultiplier Manual PT-61, RCA Electronic Components, Harrison, New Jersey 07029 (1970).
John Harding, Block Engineering, Inc., personal communication.
Robert J. Leser and Jack A. Salzman, “Light-Detection Electronics For a Raman Lidar,” NASA TN D-6879 (1972).
Tomas Hirschfeld, et al, “Remote Spectroscopic Analysis of ppm-Level Air Pollutants by Raman Spectroscopy,” Appl. Phys. Lett. 22, 38 (1973).
Michel Bridoux and Michel Delhaye, “Spectrometrie Raman-Laser Ultra-Rapide,” Nouv. Rev. d’Optique Appliquée 1, 23 (1970).
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Supplementary References Multiplex Spectroscopy:
J. F. James and R. S. Sternberg, “The Design of Optical Spectrometers,” (Chapman and Hall Ltd., London, 1969).
Robert John Bell, “Introductory Fourier Transform Spectroscopy,” (Academic Press, New York, 1972).
Manuel Cardona, “Modulation Spectroscopy,” (Academic Press, New York, 1969).
Noise Analysis:
R. H. Brown and R. Q. Twiss, “Interferonstry of The Intensity Fluctuations in Light,” Proc. Royal Society, London 242A, 300 (1957).
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Athanasios Papoulis, “The Fourier Integral and Its Applications,” (McGraw-Hill, New York, 1962).
Detectors-Imaging and Non-Imaging:
B. Kazan and M. Knoll, “Electronic Image Storage,” (Academic Press, New York, 1968).
Daniel R. Frankl, “Electrical Properties of Semiconductor Surfaces,” (Pergamon Press, New York, 1967).
R. G. Neuhauser and L. D. Miller, “Beam Landing Errors and Signal Output Uniformity of Vidicons,” Jour. of SMPTE 67, (March 1968).
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A. H. Sommer, “Photoemissive Materials,” (John Wiley & Sons, Inc., New York, 1968).
Examples of Spectroscopic Signal Processing Tricks:
H. D. Pruett, “Photon Counting System for Rapidly Scanning Low-Level Optical Spectra,” Applied Optics 11, 2529 (1972).
Erwin G. Loewen, “Diffraction Grating Handbook,” Bausch & Lomb, Inc., (1970).
Potts, Speed Suppression Programmed Scanning, Dow Chemical Co., ASTM publication.
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Schildkraut, E.R. (1974). Electronic Signal Processing for Raman Scattering Measurements. In: Lapp, M., Penney, C.M. (eds) Laser Raman Gas Diagnostics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-2103-3_16
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DOI: https://doi.org/10.1007/978-1-4684-2103-3_16
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