Skip to main content

Supersaturated Substitutional-Nitrogen Impurities in Nanosecond-Pulsed Laser Annealed Silicon

  • Conference paper
Proceedings of the 17th International Conference on the Physics of Semiconductors

Abstract

The substitutional nitrogen impurities with the neutral charge, Ns (0), can be introduced into Si by nanosecond-pulsed laser annealing. This is due to nonequilibrium process of pulsed-laser annealing involving extremely rapid recrystallization and rapid cooling. It is found from ESR and PL results that PL lines of 0.746- and 0.767-eV are associated with Ns (0). The ESR result for doping of P shallow donors into Si:N also indicates that substitutional nitrogen impurities with a negative charge, Ns (−) are formed in pulsed-laser annealed Si:N:P system.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. K.L. Brower, Phys. Rev. Lett. 44 1627 (1980) & Phys. Rev. B26, 6040 (1982).

    Article  ADS  Google Scholar 

  2. K. Murakami, K. Masuda, Y. Aoyagi and 5. Namba, Physica 116B, 564 (1983) and unpublished data.

    Google Scholar 

  3. T. Abe, K. Kikuchi, S. Shirai and S. Huraoka, Semiconductor Silicon, edited by H.R. Huff, R.J. Krieger and Y. Takeishi (Electrochem. Soc., Pennington,1981) p.54.

    Google Scholar 

  4. K. Murakami, H. Itoh, K. Takita and K. Nasuda, Physica 117B&1188,1024 (1983)

    Google Scholar 

  5. B.C. Larson, C.W. White, T.S. Noggle and J.F. Barhorst, Appl. Phys. Lett. 42, 282 (1983).

    Article  ADS  Google Scholar 

  6. M.S. Skolnick, A.G. Cullis, and H.C. Webber, Appl. Phys. Lett. 38, 464 (1981).

    Article  ADS  Google Scholar 

  7. N.B. Minaev and A.V. Mudryi, Phys. stat. sol. (a) 68, 561 (198l).

    Article  ADS  Google Scholar 

  8. T.A. Kennedy and J.H. Pifer, Phys. Rev. B11, 2017 (l975).

    Article  Google Scholar 

  9. K. Hurakami, K. Nasuda, K. Gamo, and S. Namba, Appl. Phys. Lett.: 30, 300 (1977).

    Article  ADS  Google Scholar 

  10. S.T. Pantelides and C.T. Sah, Phys. Rev. B10, 638 (1974).

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1985 Springer Science+Business Media New York

About this paper

Cite this paper

Murakami, K., Itoh, H., Takita, K., Masuda, K., Nishino, T. (1985). Supersaturated Substitutional-Nitrogen Impurities in Nanosecond-Pulsed Laser Annealed Silicon. In: Chadi, J.D., Harrison, W.A. (eds) Proceedings of the 17th International Conference on the Physics of Semiconductors. Springer, New York, NY. https://doi.org/10.1007/978-1-4615-7682-2_340

Download citation

  • DOI: https://doi.org/10.1007/978-1-4615-7682-2_340

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4615-7684-6

  • Online ISBN: 978-1-4615-7682-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics