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Measurement of Deformed Surface and Key Data Processing Based on Reverse Engineering

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Emerging Technologies for Information Systems, Computing, and Management

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 236))

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Abstract

After the metal sheet forming, the strain change should be known through some ways in order to conduct the stress analysis of forming process. To achieve this goal, some special circle marks are imprinted on the sheet surface, and after forming, the deformed circle marks should be measured. The previous method uses a Vernier Caliper to manually measure the stretched rope, which is highly laborious and inaccurate. To overcome this disadvantage, a non-contacting method is adopted to achieve all the coordinates’ data based on the structure-light principle. Then the achieved coordinates’ data of spatial surface are fitted to be a CAD model through reverse engineering (RE). In RE, the CAD surface is unfolded to be a plane or two orthogonal lines are projected on the CAD surface, so the deformed circle marks—spatial ellipses could be measured in size completely at one time. The experiments prove that the measured accuracy is about 0.01 mm, higher than the previous manual one.

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References

  1. Seungwoo, K., Yibae, C., Jungtaek, O.: Reverse engineering: high speed digitization of free-form surfaces by phase-shifting grating projection moire topography. Int. J. Mach. Tools Manuf 39(3), 389–401 (1999)

    Article  Google Scholar 

  2. Quanqing, L., Hong, W., Yingjie, Z.: Key technology analysis in reverse engineering. Mech. Des. 6(6), 4–7 (1999)

    Google Scholar 

  3. Giovanna, S., Franco, D.: Three-dimensional optical measurements and reverse engineering for automot-ive applications. Robot. Comput. Integr. Manuf. 20, 359–367 (2004)

    Google Scholar 

  4. Claverley, J.D., Georgi, A., Leach, R.K.: Modelling the interaction forces between an ideal measurement surface and the stylus tip of a novel vibrating micro-scale CMM probe. Precis. Assem. Technol. Syst. 315, 131–138 (2010)

    Article  Google Scholar 

  5. Mahesh, C., Aarti, M., Rina, S.: Roughness measurement using optical profiler with self-reference laser and stylus instrument - a comparative study. IJPAP 49(5), 335–339 (2011)

    Google Scholar 

  6. Göbel, W., Björn, M.K., Helmchen, F.: Imaging cellular network dynamics in three dimensions using fast 3D laser scanning. Nat. Method. 4, 73–79 (2007)

    Article  Google Scholar 

  7. Zhenzhong, W., Fuqiang, Z., Guangjun, Z.: 3D coordinates measurement based on structured light sensor. Sens. Actuators A Phys. 120(2), 527–535 (2005)

    Article  Google Scholar 

  8. Xuechang, Z., Xu, Z., Xuejun, G.: Reverse Modeling Technology and Innovative Design of Product. Beijing University Press, Beijing (2009)

    Google Scholar 

  9. Siyuan, C., Shaowang, X.: Reverse Engineering Technology and Application Based on Geomagic Studio. Tsinghua University press, Beijing (2010)

    Google Scholar 

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Acknowledgments

This work was supported by the Foundation of State Key Laboratory of Automotive Simulation and Control (No. 20111114); National Natural Science Foundation of China (No. 51005212 & No. 61275110); China Postdoctoral Science Foundation (No. 2011M500936 & No. 2012T50274); the Public-Service Technology Research Plan of Zhejiang Province (No. 2011C21003); the open fund of Key Laboratory of Space Laser Communication and Testing Technology from Chinese Academy of Sciences.

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Correspondence to Yongjian Zhu .

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Zhu, Y., Na, J., Wei, S. (2013). Measurement of Deformed Surface and Key Data Processing Based on Reverse Engineering . In: Wong, W.E., Ma, T. (eds) Emerging Technologies for Information Systems, Computing, and Management. Lecture Notes in Electrical Engineering, vol 236. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-7010-6_81

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  • DOI: https://doi.org/10.1007/978-1-4614-7010-6_81

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-7009-0

  • Online ISBN: 978-1-4614-7010-6

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