Abstract
As for other analog circuits, the designer has to rely on the available transistor models during PUF design. This is especially important if the error correction implementation is also done at the same time. In this case, the error rate has to be estimated using Monte Carlo simulation. Unfortunately, the simulation often does not provide reliable results when it comes to temperature-dependent error rates. In this chapter, this problem is described in detail and a way to refine the Monte Carlo mismatch models is suggested.
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References
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© 2013 Springer Science+Business Media New York
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Böhm, C., Hofer, M. (2013). Refine Models for PUF Simulation Requirements. In: Physical Unclonable Functions in Theory and Practice. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-5040-5_7
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DOI: https://doi.org/10.1007/978-1-4614-5040-5_7
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