Abstract
In this study we have measured Hc2(T) and Jc(4.2K) on a series of NbN thin films which have a fine (5 nm) equiaxed grain structure with no evidence for columnar voids. Samples with a range of critical temperatures and resistivities have been made by varying the percentage of nitrogen in argon during the deposition. The slope of the upper critical field at Tc saturates for ρ > 250 µΩ-cm (the calculated maximum resistivity for NbN). Despite the lack of columnar grain structure, Hc2 is anisotropic, with HC2(┴) > Hc2(//). At low temperatures Hc2(T) is limited by Pauli paramagnetism (λso ≈ 5) which suggests that further increases in Hc2(0) may be possible if additional spin-orbit scattering can be induced in the material. Finally, the critical currents for these very fine-grained samples are similar to the values found by others in larger columnar-grained samples.
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References
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© 1986 Plenum Press, New York
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Juang, J.Y., Rudman, D.A., van Dover, R.B., Sinclair, W.R., Bacon, D.D. (1986). Dependence of the Upper Critical Field and Critical Current on Resistivity in NbN Thin Films. In: Reed, R.P., Clark, A.F. (eds) Advances in Cryogenic Engineering Materials . Advances in Cryogenic Engineering Materials , vol 32. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9871-4_77
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DOI: https://doi.org/10.1007/978-1-4613-9871-4_77
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