Abstract
Since the first disclosure of the acoustic material signature1, the acoustic microscope has been explored to perform both imaging and metrology functions2 on a variety of specimens in industry and in the scientific laboratory. The acoustic material signature (AMS) has been refined3 to yield increasingly quantitative information of acoustic velocities in homogeneous and layered structures. However, the imaging mode, though it led to the visualization of subsurface structures5 and associated defects6, has to date been used largely as a qualitative tool in nondestructive evaluation.
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References
R. D. Weglein, “A Model for Predicting Acoustic Material Signatures,” Appl. Phys. Lett., 34:171 (1979).
R. D. Weglein, “Metrology and Imaging in the Acoustic Microscope,” in “Scanned Image Microscopy,” E. A. Ash, Ed. Academic Press, London (1980).
H. L. Bertoni, “Ray-Optical Evaluation of V(z) in the Reflection Acoustic. Microscope,” IEEE Trans. Sonics and Ultrasonics, SU-31:105 (1984).
J. Kushibiki, T Matsumoto and N. Chubachi, “Spectral Analysis of Acoustic Property from V(z) curves measured by the Line Focus Beam Acoustic Microscope,” Paper W-4 Ultrasonic Symposium, to be published (1984).
C. S. Tsai, S. K. Wang and C. C. Lee, “Visualization of Solid Material Joints using a Transmission-Type Scanning Acoustic Microscope,” Appl. Phys. Lett., 31:317 (1977).
R. D. Weglein, “Integrated Circuit Inspection via Acoustic Microscopy,” IEEE Trans. Sonics and Ultrasonics, 30:40 (1983).
A. K. Mal, T. Kundu and P. C. Xu, “On the surface response of a multilayered solid to a dislocation source,” Proc. ASME Symposium, Ed. S. K. Datta, AMD-60:29 (1984)
T. Kundu, A. K. Mal and R. D. Weglein, “Calculations of the Acoustic Material Signature of a Layered Solid,” Jour. Acoust. Soc. Am., 77:353 (1985).
Scanned Image Microscopy (book), E. A. Ash, Editor (1980); provides a broad view of the subject in addition to the relevant references listed above. See also Reference 2 above.
R. D. Weglein, R. F. Wilson and B. W. Maxfield, “A Precision Acoustic Microscope for Surface Characterization,” Proc. Ultrasonics International (Butterworth, Journals Division, Guildford, Surrey, U. K.) - :270 (1983).
B. N. Cox and R. C. Addison, “Modeling the Acoustic Material Signature in the Presence of a Surface-Breaking Crack,” Review of Progress in Quantitative NDE, D. 0. Thompson and D. E. Chimenti, Co-Eds. Vol. 3A-B Plenum Press, to be published (1983).
C. Ilett, M. G. Somekh and G. A. D. Briggs, “Acoustic Microscopy of Elastic Discontinuities,” Proc. R. Soc., London, A393:171 (1984).
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© 1985 Plenum Press, New York
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Weglein, R.D., Mal, A.K. (1985). Toward Quantitative Imaging with the Acoustic Microscope. In: Berkhout, A.J., Ridder, J., van der Wal, L.F. (eds) Acoustical Imaging. Acoustical Imaging, vol 14. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2523-9_35
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DOI: https://doi.org/10.1007/978-1-4613-2523-9_35
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