Skip to main content

Numerical Techniques for Ray Tracing and Calculation of Aberrations

  • Chapter
Electron and Ion Optics

Part of the book series: Microdevices ((MDPF))

  • 540 Accesses

Abstract

Once the focusing fields have been determined (see Chapter 3), one can proceed to trace the particle trajectories according to Chapter 4 and then calculate the aberration coefficients (Chapter 5). Although it is quite possible to solve the general ray equation (4-21) directly by numerical methods, usually we restrict the treatment to paraxial trajectories, which are totally adequate t o determine the aberrations as well. Then we only have to know the axial potential and flux density distributions to gain complete information about the optical properties of the given focusing system.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 149.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 199.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1988 Plenum Press, New York

About this chapter

Cite this chapter

Szilagyi, M. (1988). Numerical Techniques for Ray Tracing and Calculation of Aberrations. In: Electron and Ion Optics. Microdevices. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0923-9_6

Download citation

  • DOI: https://doi.org/10.1007/978-1-4613-0923-9_6

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8247-1

  • Online ISBN: 978-1-4613-0923-9

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics