Abstract
In the semiconductor industry, the study of reliability and the ability to predict temperature cycling fatigue life of electronic packaging are of significance. For that purpose, researchers and engineers frequently employ the finite element method (FEM) in their analyses. It is primarily a mechanics analysis tool that takes material properties, manufacturing processes, and environmental factors into consideration. Engineers also like to use FEM in their design of electronic package, but frequently the term ``reliabilityā€¯ they refer to only addresses the robustness of a particular design. It has little to do with probability and statistics. Meanwhile, in manufacturing factories of electronic products, including packaging, accelerated life testing (ALT) is carried out very often by quality engineers to find lives of a product in more severe environmental conditions than those of the field condition. Through regression analysis of the test result based on an empirical or semiempirical formula, the acceleration factor (AF) can be obtained for use in predicting service life of the product in field condition. Again, other than regression analysis, little probability and statistics are involved. By taking parameter uncertainties into consideration, this chapter demonstrates by an example that FEM, ALT, and AF can be combined to study the reliability of electronic packaging in which probability and statistics are applied.
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References
Lau, J.H.: Recent advances and trends in fan-out wafer/panel-level packaging. ASME J. Electron. Packag. 141(4), 040801 (2019)
Lau, J.H.: Recent advances and new trends in flip chip technology. ASME J. Electron. Packag. 138(3), 1--23 (2016)
Lau, J.H.: Fan-Out Wafer-Level Packaging. Springer, Singapore (2018)
Lau, J.H.: 3D IC Integration and Packaging. McGraw-Hill Book Company, New York (2016)
Viswanadham, P.: Essentials of Electronic Packaging: A Multidisciplinary Approach, Electronic Packaging Book Series. ASME, New York (2011)
Broughton, J., Smet, V., Tummala, R.R., Joshi, Y.K.: Review of thermal packaging technologies for automotive power electronics for traction purposes. ASME J. Electron. Packag. 140(4), 040801 (2018)
Shen, Y., Zhang, L., Zhu, W., Zhou, J., Fan, X.: Finite-element analysis and experimental test for a capped-die flip chip package design. IEEE Trans. Compon. Packag. Manuf. Technol. 6(9), 1308--1316 (2016)
Shao, J., Zhang, H., Chen, B.: Experimental study on the reliability of PBGA electronic packaging under shock loading. Electronics. 8(3), 279 (2019)
Zulkifli, M.N., Jamal, Z.A.Z., Quadir, G.A.: Temperature cycling analysis for ball grid array package using finite element analysis. Microelectron. Int. 28(1), 17--28 (2011)
Jagarkal, S.G., Hossain, M.M., Agonafer, D., Lulu, M., Reh, S.: Design optimization and reliability of PWB level electronic package. In: IEEE Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, Vol. 2, pp. 368--376 (2004)
Coffin Jr., L.F.: A study of the effects of cyclic thermal stresses on a ductile metal. Trans. ASME. 76, 931--950 (1954)
Manson, S.S.: Thermal Stress and Low-Cycle Fatigue. McGraw-Hill, New York (1966)
Norris, K.C., Landzberg, A.H.: Reliability of controlled collapse interconnections. IBM J. Res. Dev. 13(3), 266--271 (1969)
Che, F.X., Pang, J.H., Xiong, B.S., Xu, L., Low, T.H.: Lead free solder joint reliability characterization for PBGA, PQFP and TSSOP assemblies. In: Proceedings of IEEE 55th Electronic Components and Technology Conference, pp. 916--921 (2005)
Su, C.Y.: Probabilistic design and reliability analysis of flip-chip chip scale packages under accelerated environmental conditions. Ph.D. Dissertation, National Taiwan University, Taipei (2012)
Chou, P.L.: Investigation of fatigue life of wafer-level chip-scale packages under thermal cycling conditions by acceleration models. M.S. Thesis, National Taiwan University, Taipei (2012)
JEDEC Solid State Technology Association: JESD22-A104C: Temperature Cycling (2005)
Darveaux, R., Turlik, I., Hwang, L.T., Reisman, A.: Thermal stress analysis of a multichip package design. IEEE Trans. Compon. Hybrids Manuf. Technol. 12(4), 663--672 (1989)
Kim, D.H., Elenius, P., Barrett, S.: Solder joint reliability and characteristics of deformation and crack growth of Sn-Ag-Cu versus eutectic Sn-Pb on a WLP in a thermal cycling test. IEEE Trans. Electron. Packag. Manuf. 25(2), 84--90 (2002)
Meilunas, M., Primavera, A., Dunford, S.O.: Reliability and failure analysis of lead-free solder joints. In: Proceedings of the IPC Annual Meeting (2002)
Syed, A.: Accumulated creep strain and energy density based thermal fatigue life prediction models for SnAgCu solder joints. Proceedings of IEEE 54th. Electronic Components and Technology Conference, Vol. 1, pp. 737--746 (2004)
Pang, J.H.L.: Lead Free Solder: Mechanics and Reliability. Springer, New York (2011)
Lai, Y.S., Wang, T.H.: Verification of submodeling technique in thermomechanical reliability assessment of flip-chip package assembly. Microelectron. Reliab. 45(3), 575--582 (2005)
Pang, J.H.L., Low, T.H., Xiong, B.S., Che, F.X.: Design for reliability (DFR) methodology for electronic packaging assemblies. In: Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003), pp. 470--478 (2003)
Lall, P., Shirgaokar, A., Arunachalam, D.: Norris--Landzberg acceleration factors and Goldmann constants for SAC305 lead-free electronics. ASME Journal of Electronic Packaging. 134(3), 031008 (2012)
Pan, N., Henshall, G.A., Billaut, F., Dai, S., Strum, N.J., Lewis, R., Benedetto, E., Rayner, J.: An acceleration model for Sn-Ag-Cu solder joint reliability under various thermal cycle conditions. In: Proceedings of the SMTA International Conference, pp. 876--883 (2005)
Salmela, O., Andersson, K., Sarkka, J., Tammenmaa, M.: Reliability analysis of some ceramic lead-free solder attachments. In: Proceedings of the SMTA Pan Pacific Conference, pp. 161--169 (2005)
Zhang, R., Clech, J.P.: Applicability of various Pb-free solder joint acceleration factor models. In: Proceedings of the SMTA International Conference (2006)
Dauksher, W.: A second-level SAC solder-joint fatigue-life prediction methodology. IEEE Trans. Device Mater. Reliab. 8(1), 168--173 (2008)
Vasudevan, V., Fan, X.: An acceleration model for lead-free (SAC) solder joint reliability under thermal cycling. In: Proceedings of the 2008 Electronic Components and Technology Conference, IEEE, pp. 139--145 (2008)
Jong, W.R., Chen, S.C., Tsai, H.C., Chiu, C.C., Chang, H.T.: The geometrical effects of bumps on the fatigue life of flip-chip packages by Taguchi method. J. Reinf. Plast. Compos. 25(1), 99--114 (2006)
Mercado, L.L., Sarihan, V.: Predictive design of flip-chip PBGA for high reliability and low cost. In: Proceedings of the 2008 Electronic Components and Technology Conference, IEEE, pp. 1111--1115 (1999)
Perkins, A., Sitaraman, S.K.: Universal fatigue life prediction equation for ceramic ball grid array (CBGA) packages. Microelectron. Reliab. 47(12), 2260--2274 (2007)
Wu, M.L., Barker, D.: Rapid assessment of BGA life under vibration and bending, and influence of input parameter uncertainties. Microelectron. Reliab. 50(1), 140--148 (2010)
Cheng, H.C., Yu, C.Y., Chen, W.H.: An effective thermal-mechanical modeling methodology for large-scale area array typed packages. Comput. Model. Eng. Sci. 7(1), 1--17 (2005)
Salmela, O.: Acceleration factors for lead-free solder materials. IEEE Trans. Compon. Packag. Technol. 30(4), 161--169 (2005)
Wei, H.P., Yang, Y.H., Han, B.: Stacking yield prediction of package-on-package assembly using advanced uncertainty propagation analysis: part I stochastic model development. ASME J. Electron. Packag. 142(1), 011001 (2020)
Wei, H.P., Yang, Y.H., Han, B.: Stacking yield prediction of package-on-package assembly using advanced uncertainty propagation analysis: part II implementation of stochastic model. ASME J. Electron. Packag. 142(1), 011002 (2020)
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Wu, WF., Lu, YA. (2023). Reliability of Electronic Packaging. In: Pham, H. (eds) Springer Handbook of Engineering Statistics. Springer Handbooks. Springer, London. https://doi.org/10.1007/978-1-4471-7503-2_50
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DOI: https://doi.org/10.1007/978-1-4471-7503-2_50
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